Piecewise-functional broadside tests based on intersections of reachable states

2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) ◽

10.1109/dft.2015.7315150 ◽

2015 ◽

Cited By ~ 1

Author(s):

Irith Pomeranz

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