A BIST approach for counterfeit circuit detection based on NBTI degradation

2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) ◽

10.1109/dft.2015.7315148 ◽

2015 ◽

Cited By ~ 2

Author(s):

Puneet Ramesh Savanur ◽

Phaninder Alladi ◽

Spyros Tragoudas

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