Improving the Detectability of Resistive Open Faults in Scan Cells

2009 ◽  
Author(s):  
Fan Yang ◽  
Sreejit Chakravarty ◽  
Narendra Devta-Prasanna ◽  
Sudhakar M. Reddy ◽  
Irith Pomeranz
Keyword(s):  
Open Faults

Fault Isolation of Open Defects Using Space Domain Reflectometry

2012 ◽  
Author(s):  
Mayue Xie ◽  
Zhiguo Qian ◽  
Mario Pacheco ◽  
Zhiyong Wang ◽  
Rajen Dias ◽  
...  
Keyword(s):  
Integrated Circuits ◽  
Fault Isolation ◽  
Nondestructive Technique ◽  
Space Domain ◽  
New Approach ◽  
Defect Localization ◽  
Open Faults ◽  
Open Defects ◽  
Application Optimization ◽  
Rf Magnetic Field

Abstract Recently, a new approach for isolation of open faults in integrated circuits (ICs) was developed. It is based on mapping the radio-frequency (RF) magnetic field produced by the defective part fed with RF probing current, giving the name to Space Domain Reflectometry (SDR). SDR is a non-contact and nondestructive technique to localize open defects in package substrates, interconnections and semiconductor devices. It provides 2D failure isolation capability with defect localization resolution down to 50 microns. It is also capable of scanning long traces in Si. This paper describes the principles of the SDR and its application for the localization of open and high resistance defects. It then discusses some analysis methods for application optimization, and gives examples of test samples as well as case studies from actual failures.

Detecting FET Stuck-Open Faults in CMOS Latches And Flip-Flops

1986 ◽  
Vol 3 (5) ◽  
pp. 17-26 ◽  
Author(s):  
Madhukar K. Reddy ◽  
Sudhakar M. Reddy
Keyword(s):  
Open Faults

Universal and robust testing of stuck-open faults in Reed–Muller canonical CMOS circuits

2003 ◽  
Vol 90 (1) ◽  
pp. 1-11 ◽  
Author(s):  
Debesh K. Das ◽  
Susanta Chakraborty ◽  
Bhargab B. Bhattacharya
Keyword(s):  
Cmos Circuits ◽  
Robust Testing ◽  
Open Faults

Detection of Internal Stuck-open Faults in Scan Chains

2008 ◽  
Author(s):  
F. Yang ◽  
S. Chakravarty ◽  
N. Devta-Prasanna ◽  
S.M. Reddy ◽  
I. Pomeranz
Keyword(s):  
Open Faults ◽  
Scan Chains

Open faults in BiCMOS gates

1995 ◽  
Vol 14 (5) ◽  
pp. 567-575 ◽  
Author(s):  
S.C. Ma ◽  
E.J. McCluskey
Keyword(s):  
Open Faults
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