Gate Failures Effectively Shape Multiplexing

2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems ◽

10.1109/dft.2006.33 ◽

2006 ◽

Cited By ~ 13

Author(s):

V. Beiu ◽

W. Ibrahim ◽

Y.A. Alkhawwar ◽

M.H. Sulieman

Download Full-text