Fitting ATE channels with scan chains: a comparison between a test data compression technique and serial loading of scan chains

Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06) ◽

10.1109/delta.2006.49 ◽

2006 ◽

Cited By ~ 5

Author(s):

J. Dalmasso ◽

M.-L. Flottes ◽

B. Rouzeyre

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Compression Technique ◽

Scan Chains

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Test data compression technique for embedded cores using virtual scan chains

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.2004.830911 ◽

2004 ◽

Vol 12 (7) ◽

pp. 775-781 ◽

Cited By ~ 9

Author(s):

A. Jas ◽

B. Pouya ◽

N.A. Touba

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Compression Technique ◽

Embedded Cores ◽

Scan Chains

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Test data compression technique based on partial data block reuse in SoC

JOURNAL OF ELECTRONIC MEASUREMENT AND INSTRUMENT ◽

10.3724/sp.j.1187.2010.00487 ◽

2010 ◽

Vol 24 (5) ◽

pp. 487-493

Author(s):

Yiming Ouyang ◽

Xi'e Huang ◽

Huaguo Liang ◽

Baosheng Zou

Keyword(s):

Data Compression ◽

Test Data ◽

Data Block ◽

Test Data Compression ◽

Compression Technique ◽

Partial Data

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Systems-on-Chip: Use of Test Data Compression Technique for Reducing Test Time

2007 Ph.D Research in Microelectronics and Electronics Conference ◽

10.1109/rme.2007.4401819 ◽

2007 ◽

Author(s):

Julien Dalmasso ◽

Marie-Lise Flottes ◽

Bruno Rouzeyre

Keyword(s):

Data Compression ◽

Test Data ◽

Test Time ◽

Test Data Compression ◽

Compression Technique ◽

Systems On Chip ◽

On Chip

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Multilevel-Huffman Test-Data Compression for IP Cores With Multiple Scan Chains

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.2008.2000448 ◽

2008 ◽

Vol 16 (7) ◽

pp. 926-931 ◽

Cited By ~ 29

Author(s):

Xrysovalantis Kavousianos ◽

Emmanouil Kalligeros ◽

Dimitris Nikolos

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Multiple Scan ◽

Scan Chains ◽

Ip Cores

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Efficient test data compression and decompression for system-on-a-chip using internal scan chains and Golomb coding

Proceedings Design, Automation and Test in Europe. Conference and Exhibition 2001 ◽

10.1109/date.2001.915015 ◽

2002 ◽

Cited By ~ 23

Author(s):

A. Chandra ◽

K. Chakrabarty

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Efficient Test ◽

System On A Chip ◽

Scan Chains

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Hybrid test data compression technique for SOC scan testing

2005 Joint 30th International Conference on Infrared and Millimeter Waves and 13th International Conference on Terahertz Electronics ◽

10.1109/socc.2005.1554457 ◽

2005 ◽

Author(s):

Sangwook Cho ◽

Jaehoon Song ◽

Hyunbean Yi ◽

Sungju Park

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Compression Technique ◽

Scan Testing ◽

Hybrid Test

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A novel test-data compression technique using application-aware bitmask and dictionary selection methods

Proceedings of the 18th ACM Great Lakes symposium on VLSI - GLSVLSI '08 ◽

10.1145/1366110.1366132 ◽

2008 ◽

Cited By ~ 8

Author(s):

Kanad Basu ◽

Prabhat Mishra

Keyword(s):

Data Compression ◽

Test Data ◽

Selection Methods ◽

Test Data Compression ◽

Compression Technique ◽

Application Aware

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Multistage test data compression technique for VLSI circuits

2016 International Conference on Advanced Communication Control and Computing Technologies (ICACCCT) ◽

10.1109/icaccct.2016.7831602 ◽

2016 ◽

Author(s):

Anju Asokan ◽

J.P. Anita

Keyword(s):

Data Compression ◽

Test Data ◽

Vlsi Circuits ◽

Test Data Compression ◽

Compression Technique ◽

Multistage Test

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Survey of Test Data Compression Technique Emphasizing Code Based Schemes

2009 12th Euromicro Conference on Digital System Design, Architectures, Methods and Tools ◽

10.1109/dsd.2009.134 ◽

2009 ◽

Cited By ~ 7

Author(s):

Usha Sandeep Mehta ◽

K.S. Dasgupta ◽

N.M. Devashrayee

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Compression Technique

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SoC Test Data Compression Technique Based on RLE-G

Key Engineering Materials ◽

10.4028/www.scientific.net/kem.439-440.1595 ◽

2010 ◽

Vol 439-440 ◽

pp. 1595-1600

Author(s):

Chun Jian Deng ◽

Liu Wei ◽

Xi Feng Zheng ◽

Liang Yang

Keyword(s):

Data Compression ◽

Test Data ◽

Test Time ◽

Test Data Compression ◽

Compression Technique ◽

Current Test ◽

Soc Test ◽

Efficient Test ◽

Data Volume ◽

Test Vectors

Test data compression has been an effective way to reduce test data volume and test time, as well as to solve automatic test equipment (ATE) memory and bandwidth limitation. We analyze the limitations of current test data compression algorithm and draw on the previous experience to deduce an optimal compression coding model suitable for SoC test data. In addition, in this paper we make full use of the relevance of the test vectors and the advantages of statistical coding to present an efficient test data compression method RLE-G based on the coding model, and give the RLE-G the optimal compression efficiency of the boundary conditions and realization steps. The experimental results for ISCAS 89 benchmark circuits demonstrate RLE-G have the excellent advantages of high compression ratio.

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