scholarly journals A Unique March Test Algorithm for the Wide Spread of Realistic Memory Faults in SRAMs

2006 ◽  
Author(s):  
A. Benso ◽  
A. Bosio ◽  
S. Di Carlo ◽  
G. Di Natale ◽  
P. Prinetto
Keyword(s):  
Wide Spread ◽  
March Test ◽  
Memory Faults ◽  
Test Algorithm

scholarly journals Fault Detection with Optimum March Test Algorithm

2012 ◽  
Author(s):  
Nor Azura Zakaria ◽  
W.Z.W. Hasan ◽  
I.A. Halin ◽  
R.M. Sidek ◽  
Xiaoqing Wen
Keyword(s):  
Fault Detection ◽  
March Test ◽  
Test Algorithm

Defect Analysis and Parallel March Test Algorithm for 3D Hybrid CMOS-Memristor Memory

2018 ◽  
Author(s):  
Peng Liu ◽  
Jigang Wu ◽  
Zhiqiang You ◽  
Michael Elimu ◽  
Weizheng Wang ◽  
...  
Keyword(s):  
Defect Analysis ◽  
March Test ◽  
Hybrid Cmos ◽  
Test Algorithm

scholarly journals Finite State Machine based Programmable Memory Built-in Self-Test

2021 ◽  
Vol 9 (VI) ◽  
pp. 3805-3809
Author(s):  
B V S Sai Praneeth
Keyword(s):  
Finite State Machine ◽  
State Machine ◽  
March Test ◽  
Multiple Test ◽  
Memory Modules ◽  
Finite State ◽  
Self Test ◽  
Built In Self Test ◽  
On Chip ◽  
Test Algorithm

We propose a methodology to design a Finite State Machine(FSM)-based Programmable Memory Built-In Self Test (PMBIST) which includes a planned procedure for Memory BIST which has a controller to select a test algorithm from a fixed set of algorithms that are built in the memory BIST. In general, it is not possible to test all the different memory modules present in System-on-Chip (SoC) with a single Test algorithm. Subsequently it is desirable to have a programmable Memory BIST controller which can execute multiple test algorithms. The proposed Memory BIST controller is designed as a FSM (Finite State Machine) written in Verilog HDL and this scheme greatly simplifies the testing process and it achieves a good flexibility with smaller circuit size compared with Individual Testing designs. We have used March test algorithms like MATS+, March X, March C- to build the project.

Efficient March test algorithm for 1T1R cross‐bar with complete fault coverage

2016 ◽  
Vol 52 (18) ◽  
pp. 1520-1522 ◽  
Author(s):  
Peng Liu ◽  
Zhiqiang You ◽  
Jishun Kuang ◽  
Zhipeng Hu ◽  
Heng Duan ◽  
...  
Keyword(s):  
Fault Coverage ◽  
March Test ◽  
Test Algorithm

SEM Examination of a Used Diamond Knife

1971 ◽  
Vol 29 ◽  
pp. 452-453
Author(s):  
J. Temple Black
Keyword(s):  
Electron Microscope ◽  
High Voltage ◽  
High Magnification ◽  
Metallic Materials ◽  
Wide Spread ◽  
Thin Sections ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Scanning Electron ◽  
Diamond Knife

Since its introduction by Fernandez-Moran, the diamond knife has gained wide spread usage as a common material for cutting of thin sections of biological and metallic materials into thin films for examination in the transmission electron microscope. With the development of high voltage E.M. and scanning transmission E.M., microtomy applications will become increasingly important in the preparation of specimens. For those who can afford it, the diamond knife will thus continue to be an important tool to accomplish this effort until a cheaper but equally strong and sharp tool is found to replace the diamond, glass not withstanding.In Figs. 1 thru 3, a first attempt was made to examine the edge of a used (β=45°) diamond knife by means of the scanning electron microscope. Because diamond is conductive, first examination was tried without any coating of the diamond. However, the contamination at the edge caused severe charging during imaging. Next, a thin layer of carbon was deposited but charging was still extensive at high magnification - high voltage settings. Finally, the knife was given a light coating of gold-palladium which eliminated the charging and allowed high magnification micrographs to be made with reasonable resolution.

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