Feasibility of current measurements in sub 0.25-micron VLSIs

Proceedings 2000 IEEE International Workshop on Defect Based Testing (Cat. No.PR00637) ◽

10.1109/dbt.2000.843683 ◽

2002 ◽

Author(s):

A. Keshavarzi ◽

S. Borkar ◽

V. De

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