Procedures for static compaction of test sequences for synchronous sequential circuits based on vector restoration

Proceedings Design, Automation and Test in Europe ◽

10.1109/date.1998.655917 ◽

2002 ◽

Cited By ~ 24

Author(s):

R. Guo ◽

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Sequential Circuits ◽

Synchronous Sequential Circuits ◽

Static Compaction

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Dynamic test compaction for synchronous sequential circuits using static compaction techniques

Proceedings of Annual Symposium on Fault Tolerant Computing ◽

10.1109/ftcs.1996.534594 ◽

2002 ◽

Cited By ~ 21

Author(s):

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Dynamic Test ◽

Sequential Circuits ◽

Test Compaction ◽

Synchronous Sequential Circuits ◽

Static Compaction

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Vector restoration based static compaction of test sequences for synchronous sequential circuits

Proceedings International Conference on Computer Design VLSI in Computers and Processors ICCD-97 ◽

10.1109/iccd.1997.628895 ◽

2002 ◽

Cited By ~ 86

Author(s):

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Sequential Circuits ◽

Synchronous Sequential Circuits ◽

Static Compaction

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Procedures for static compaction of test sequences for synchronous sequential circuits

IEEE Transactions on Computers ◽

10.1109/12.862219 ◽

2000 ◽

Vol 49 (6) ◽

pp. 596-607 ◽

Cited By ~ 6

Author(s):

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Sequential Circuits ◽

Synchronous Sequential Circuits ◽

Static Compaction

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On static compaction of test sequences for synchronous sequential circuits

33rd Design Automation Conference Proceedings, 1996 ◽

10.1109/dac.1996.545575 ◽

2005 ◽

Cited By ~ 1

Author(s):

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Sequential Circuits ◽

Synchronous Sequential Circuits ◽

Static Compaction

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COREL: a dynamic compaction procedure for synchronous sequential circuits with repetition and local static compaction

Proceedings 2001 IEEE International Conference on Computer Design: VLSI in Computers and Processors. ICCD 2001 ◽

10.1109/iccd.2001.955016 ◽

2002 ◽

Author(s):

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Sequential Circuits ◽

Dynamic Compaction ◽

Synchronous Sequential Circuits ◽

Static Compaction

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On static compaction of test sequences for synchronous sequential circuits

33rd Design Automation Conference Proceedings, 1996 ◽

10.1145/240518.240558 ◽

1996 ◽

Cited By ~ 84

Author(s):

Irith Pomeranz ◽

Sudhakar M. Reddy

Keyword(s):

Sequential Circuits ◽

Synchronous Sequential Circuits ◽

Static Compaction

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New methods for parallel pattern fast fault simulation for synchronous sequential circuits

Proceedings ETC 93 Third European Test Conference ◽

10.1109/etc.1993.246617 ◽

2002 ◽

Author(s):

M. Mojtahedi ◽

W. Geisselhardt

Keyword(s):

Fault Simulation ◽

Sequential Circuits ◽

New Methods ◽

Synchronous Sequential Circuits ◽

Parallel Pattern

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Resynthesis and retiming of synchronous sequential circuits

1993 IEEE International Symposium on Circuits and Systems ◽

10.1109/iscas.1993.394063 ◽

2002 ◽

Cited By ~ 4

Author(s):

S. Lejmi ◽

B. Kaminska ◽

E. Wagneur

Keyword(s):

Sequential Circuits ◽

Synchronous Sequential Circuits

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Built-in test sequence generation for synchronous sequential circuits based on loading and expansion of test subsequences

Proceedings of the 36th ACM/IEEE conference on Design automation conference - DAC '99 ◽

10.1145/309847.310052 ◽

1999 ◽

Author(s):

Irith Pomeranz ◽

Sudhakar M. Reddy

Keyword(s):

Sequential Circuits ◽

Test Sequence ◽

Sequence Generation ◽

Synchronous Sequential Circuits ◽

Test Sequence Generation

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Synchronous Sequential Circuits

Computer Organization, Design, and Architecture, Fifth Edition ◽

10.1201/b16435-5 ◽

2013 ◽

pp. 139-204

Keyword(s):

Sequential Circuits ◽

Synchronous Sequential Circuits

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