Work-in-Progress: AMVP - A High Performance Virtual Platform using Parallel SystemC for Multicore ARM Architectures

2018 ◽  
Author(s):  
Jan Henrik Weinstock ◽  
Robert Lajos Bucs ◽  
Florian Walbroel ◽  
Rainer Leupers ◽  
Gerd Ascheid
Keyword(s):  
High Performance ◽  
Work In Progress ◽  
Virtual Platform

scholarly journals DESIGNING A MULTI-PRECISION NUMBER THEORY LIBRARY

2014 ◽  
pp. 44-48
Author(s):  
Catalin Hritcu ◽  
Iulian Goriac ◽  
Raluca Mihaela Gordan ◽  
Elena Erbiceanu
Keyword(s):  
Number Theory ◽  
Memory Management ◽  
High Performance ◽  
Number Representation ◽  
Algorithm Selection ◽  
Basic Principles ◽  
Work In Progress ◽  
Large Numbers

The aim of this paper is twofold. First, we present the basic principles and point out the main difficulties in writing a library supporting operations with arbitrarily large numbers. Aspects such as library structure, number representation, algorithm selection, memory management, etc., are discussed and exemplified on the most efficient libraries developed. Secondly, we present work in progress regarding the design of a new multi-precision library, MpNT. Comparisons between our library and the existing ones show that it achieves high performance.

scholarly journals Cosimulation of Power and Temperature Models at the SystemC/TLM for a Soft-Core Processor

2020 ◽  
Vol 2020 ◽  
pp. 1-7
Author(s):  
Zineb El Hariti ◽  
Abdelhakim Alali ◽  
Mohamed Sadik ◽  
Kaoutar Aamali
Keyword(s):  
High Performance ◽  
System Level ◽  
Limiting Factor ◽  
Power Budget ◽  
Technology Roadmap ◽  
Systems On Chip ◽  
Limited Power ◽  
Virtual Platform ◽  
On Chip ◽  
Technology Nodes

Nowadays, modern embedded applications are becoming more and more complex and resource demanding. Fortunately, Systems on Chip (SoC) are one of the keys used to follow their requirements that stand in need of high performance while maintaining a low-power profile. On one hand, today, due to the limited power budget imposed by the batteries, power is the limiting factor of the logic CMOS. On the other hand, the downscaling of the technology node for 65 nm and beyond, based on the International Technology Roadmap for Semiconductors (ITRS) as a reference, has not only resulted in huge energy consumption but also increased the temperature chip. To address this challenge, designing at the system level is the suitable measure to tackle with the complexity of the Systems on Chip, aiming at having better adjustment between timing and accuracy for power and temperature estimations. We present in this paper, at the first stage, two models describing the static and dynamic power at the physical level. These models are implemented on an open virtual platform Model Power-Consumption and Temperature in SystemC/TLM (LIBTLMPWT) based on a representative SoC architecture. At the second stage, we focus on power, especially the thermal behaviour of the chip while running three benchmarks set on the game of life application for two different technology nodes.

Meridional Circulation, Turbulence, and Diffusion Processes in Stars

1976 ◽  
Vol 32 ◽  
pp. 109-116 ◽  
Author(s):  
S. Vauclair
Keyword(s):  
Convection Zone ◽  
Diffusion Processes ◽  
Meridional Circulation ◽  
Diffusion Time ◽  
Work In Progress ◽  
First Results ◽  
Stellar Envelopes ◽  
And Diffusion ◽  
Turbulence And Diffusion ◽  
Hr Diagram

This paper gives the first results of a work in progress, in collaboration with G. Michaud and G. Vauclair. It is a first attempt to compute the effects of meridional circulation and turbulence on diffusion processes in stellar envelopes. Computations have been made for a 2 Mʘstar, which lies in the Am - δ Scuti region of the HR diagram.Let us recall that in Am stars diffusion cannot occur between the two outer convection zones, contrary to what was assumed by Watson (1970, 1971) and Smith (1971), since they are linked by overshooting (Latour, 1972; Toomre et al., 1975). But diffusion may occur at the bottom of the second convection zone. According to Vauclair et al. (1974), the second convection zone, due to He II ionization, disappears after a time equal to the helium diffusion time, and then diffusion may happen at the bottom of the first convection zone, so that the arguments by Watson and Smith are preserved.

A High Performance Energy Analyzer for Use in Electron Scanning Microscopy

1969 ◽  
Vol 27 ◽  
pp. 14-15
Author(s):  
A. V. Crewe ◽  
M. Isaacson ◽  
D. Johnson
Keyword(s):  
High Performance ◽  
Vertical Plane ◽  
Median Plane ◽  
Electron Gun ◽  
Uniform Field ◽  
Loss Mechanism ◽  
Electron Scanning Microscopy ◽  
Sector Type ◽  
Double Focusing ◽  
Electron Energy Loss

A double focusing magnetic spectrometer has been constructed for use with a field emission electron gun scanning microscope in order to study the electron energy loss mechanism in thin specimens. It is of the uniform field sector type with curved pole pieces. The shape of the pole pieces is determined by requiring that all particles be focused to a point at the image slit (point 1). The resultant shape gives perfect focusing in the median plane (Fig. 1) and first order focusing in the vertical plane (Fig. 2).

Vacuum System to Minimize the Specimen Contamination of High-Performance EM

1977 ◽  
Vol 35 ◽  
pp. 68-69
Author(s):  
N. Yoshimura ◽  
K. Shirota ◽  
T. Etoh
Keyword(s):  
Electron Microscope ◽  
High Speed ◽  
High Performance ◽  
High Vacuum ◽  
Vacuum System ◽  
Pump System ◽  
Pumping System ◽  
Diffusion Pump ◽  
Almost All ◽  
Cascade Type

One of the most important requirements for a high-performance EM, especially an analytical EM using a fine beam probe, is to prevent specimen contamination by providing a clean high vacuum in the vicinity of the specimen. However, in almost all commercial EMs, the pressure in the vicinity of the specimen under observation is usually more than ten times higher than the pressure measured at the punping line. The EM column inevitably requires the use of greased Viton O-rings for fine movement, and specimens and films need to be exchanged frequently and several attachments may also be exchanged. For these reasons, a high speed pumping system, as well as a clean vacuum system, is now required. A newly developed electron microscope, the JEM-100CX features clean high vacuum in the vicinity of the specimen, realized by the use of a CASCADE type diffusion pump system which has been essentially improved over its predeces- sorD employed on the JEM-100C.

Use of the Magnetostatic Analogue In Electromagnetic Lens Engineering

1970 ◽  
Vol 28 ◽  
pp. 360-361
Author(s):  
John W. Coleman
Keyword(s):  
Boundary Conditions ◽  
High Performance ◽  
Force Fields ◽  
Optical Design ◽  
Direct Conversion ◽  
Design Engineering ◽  
Design Data ◽  
Scalar Potentials ◽  
Geometric Elements ◽  
At Will

In the design engineering of high performance electromagnetic lenses, the direct conversion of electron optical design data into drawings for reliable hardware is oftentimes difficult, especially in terms of how to mount parts to each other, how to tolerance dimensions, and how to specify finishes. An answer to this is in the use of magnetostatic analytics, corresponding to boundary conditions for the optical design. With such models, the magnetostatic force on a test pole along the axis may be examined, and in this way one may obtain priority listings for holding dimensions, relieving stresses, etc..The development of magnetostatic models most easily proceeds from the derivation of scalar potentials of separate geometric elements. These potentials can then be conbined at will because of the superposition characteristic of conservative force fields.

Prospects for convergent beam electron diffraction with a 200kV cold field-emission transmission electron microscope

1991 ◽  
Vol 49 ◽  
pp. 466-467
Author(s):  
J W Steeds ◽  
R Vincent
Keyword(s):  
Field Emission ◽  
High Performance ◽  
Small Diameter ◽  
Convergent Beam Electron Diffraction ◽  
Zone Axis ◽  
Medium Voltage ◽  
Transmission Electron ◽  
Good Crystallinity ◽  
Special Modification ◽  
Convergent Beam

We review the analytical powers which will become more widely available as medium voltage (200-300kV) TEMs with facilities for CBED on a nanometre scale come onto the market. Of course, high performance cold field emission STEMs have now been in operation for about twenty years, but it is only in relatively few laboratories that special modification has permitted the performance of CBED experiments. Most notable amongst these pioneering projects is the work in Arizona by Cowley and Spence and, more recently, that in Cambridge by Rodenburg and McMullan.There are a large number of potential advantages of a high intensity, small diameter, focussed probe. We discuss first the advantages for probes larger than the projected unit cell of the crystal under investigation. In this situation we are able to perform CBED on local regions of good crystallinity. Zone axis patterns often contain information which is very sensitive to thickness changes as small as 5nm. In conventional CBED, with a lOnm source, it is very likely that the information will be degraded by thickness averaging within the illuminated area.

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