Control techniques for high-speed dynamic mode imaging in atomic force microscopes

2011 ◽  
Author(s):  
Gayathri Mohan ◽  
Chibum Lee ◽  
Srinivasa Salapaka
Keyword(s):  
High Speed ◽  
Dynamic Mode ◽  
Atomic Force Microscopes ◽  
Control Techniques ◽  
Atomic Force

scholarly journals Tip wear and tip breakage in high-speed atomic force microscopes

2019 ◽  
Vol 201 ◽  
pp. 28-37 ◽  
Author(s):  
Timo Strahlendorff ◽  
Gaoliang Dai ◽  
Detlef Bergmann ◽  
Rainer Tutsch
Keyword(s):  
High Speed ◽  
Atomic Force Microscopes ◽  
Atomic Force

scholarly journals High-speed dynamic-mode atomic force microscopy imaging of polymers: an adaptive multiloop-mode approach

2017 ◽  
Vol 8 ◽  
pp. 1563-1570 ◽  
Author(s):  
Juan Ren ◽  
Qingze Zou
Keyword(s):  
Atomic Force Microscopy ◽  
High Speed ◽  
Interaction Force ◽  
Dynamic Mode ◽  
Microscopy Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
Atomic Force Microscopy Imaging ◽  
Mode Tm ◽  
Mode Atomic Force Microscopy

Adaptive multiloop-mode (AMLM) imaging to substantially increase (over an order of magnitude) the speed of tapping-mode (TM) imaging is tested and evaluated through imaging three largely different heterogeneous polymer samples in experiments. It has been demonstrated that AMLM imaging, through the combination of a suite of advanced control techniques, is promising to achieve high-speed dynamic-mode atomic force microscopy imaging. The performance, usability, and robustness of the AMLM in various imaging applications, however, is yet to be assessed. In this work, three benchmark polymer samples, including a PS–LDPE sample, an SBS sample, and a Celgard sample, differing in feature size and stiffness of two orders of magnitude, are imaged using the AMLM technique at high-speeds of 25 Hz and 20 Hz, respectively. The comparison of the images obtained to those obtained by using TM imaging at scan rates of 1 Hz and 2 Hz showed that the quality of the 25 Hz and 20 Hz AMLM imaging is at the same level of that of the 1 Hz TM imaging, while the tip–sample interaction force is substantially smaller than that of the 2 Hz TM imaging.

scholarly journals Direct Tip-Sample Force Estimation for High-Speed Dynamic Mode Atomic Force Microscopy

2014 ◽  
Vol 13 (6) ◽  
pp. 1257-1265 ◽  
Author(s):  
Kai S. Karvinen ◽  
Michael G. Ruppert ◽  
Kaushik Mahata ◽  
S. O. R. Moheimani
Keyword(s):  
Atomic Force Microscopy ◽  
High Speed ◽  
Dynamic Mode ◽  
Force Estimation ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy

scholarly journals Calibrating a high-speed contact-resonance profilometer

2020 ◽  
Vol 9 (2) ◽  
pp. 179-187
Author(s):  
Michael Fahrbach ◽  
Sebastian Friedrich ◽  
Brunero Cappella ◽  
Erwin Peiner
Keyword(s):  
Dynamic Behavior ◽  
High Speed ◽  
Large Scale ◽  
Atomic Force Microscopes ◽  
Atomic Force ◽  
Air Damping ◽  
Measurement Mode ◽  
Contact Resonance

Abstract. A European EMPIR project, which aims to use large-scale, 5 mm × 200 µm × 50 µm (L×W×H), piezoresistive microprobes for contact resonance applications, a well-established measurement mode of atomic force microscopes (AFMs), is being funded. As the probes used in this project are much larger in size than typical AFM probes, however, some of the simplifications and assumptions made for AFM probes are not applicable. This study presents a guide on how to systematically create a model that replicates the dynamic behavior of microprobes. The model includes variables such as air damping, nonlinear sensitivities, and frequency dependencies. The finished model is then verified by analyzing a series of measurements.

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