scholarly journals The Failure Trace Archive: Enabling Comparative Analysis of Failures in Diverse Distributed Systems

2010 ◽  
Author(s):  
Derrick Kondo ◽  
Bahman Javadi ◽  
Alexandru Iosup ◽  
Dick Epema
Keyword(s):  
Comparative Analysis ◽  
Distributed Systems ◽  
Trace Archive ◽  
Analysis Of Failures

scholarly journals A Comparative Analysis of Distributed and Parallel Computing

2018 ◽  
pp. 60-67
Keyword(s):  
Parallel Computing ◽  
Comparative Analysis ◽  
Distributed Systems ◽  
Data Centers ◽  
Parallel Systems ◽  
The Other ◽  
Pros And Cons ◽  
Distributed And Parallel Computing ◽  
Better Than ◽  
Computing Models

In the age of emerging technologies, the amount of data is increasing very rapidly. Due to massive increase of data the level of computations are increasing. Computer executes instructions sequentially. But the time has now changed and innovation has been advanced. We are currently managing gigantic data centers that perform billions of executions on consistent schedule. Truth be- hold, if we dive deep into the processor engineering and mechanism, even a successive machine works parallel. Parallel computing is growing faster as a substitute of distributing computing. The performance to functionality ratio of parallel systems is high. Also, the I/O usage of parallel systems is lower because of ability to perform all operations simultaneously. On the other hand, the performance to functionality ratio of distributed systems is low. The I/O usage of distributed systems is higher because of incapability to perform all operations simultaneously. In this paper, an overview of distributed and parallel computing is described. The basic concept of these two computing is discussed. In addition to this, pros and cons of distributed and parallel computing models are described. Through many aspects, we can conclude that parallel systems are better than distributed systems.

Analysis of failures of various spacecraft systems

2020 ◽  
pp. 34-46
Author(s):  
А.А. Брусков
Keyword(s):  
Comparative Analysis ◽  
Analysis Of Failures

Рассмотрены и проанализированы вопросы, связанные с анализом отказов различных систем космических аппаратов. Рассмотрен вопрос создания условий для анализа отказов в нескольких состояниях космического аппарата. Проведен сравнительный анализ надежности систем космических аппаратов. Показано, что результаты анализа отказов в нескольких состояниях могут быть использованы для дальнейшего детального изучения «физики аномалий и отказов» отдельных подсистем космического аппарата. Issues related to the analysis of failures of various spacecraft systems are considered and analyzed. The issue of creating conditions for analyzing failures in several States of the spacecraft is considered. A comparative analysis of the reliability of spacecraft systems is carried out. It is shown that the results of the analysis of failures in several States can be used for further detailed study of the « physics of anomalies and failures» of individual subsystems of the spacecraft.

scholarly journals The Failure Trace Archive: Enabling the comparison of failure measurements and models of distributed systems

2013 ◽  
Vol 73 (8) ◽  
pp. 1208-1223 ◽  
Author(s):  
Bahman Javadi ◽  
Derrick Kondo ◽  
Alexandru Iosup ◽  
Dick Epema
Keyword(s):  
Distributed Systems ◽  
Trace Archive

Some applications of electron beam microanalysis techniques in VLSI process evaluation

1983 ◽  
Vol 41 ◽  
pp. 160-161
Author(s):  
Simon Thomas
Keyword(s):  
Integrated Circuits ◽  
Process Evaluation ◽  
Large Scale ◽  
Technology Development ◽  
Analytical Techniques ◽  
Successful Implementation ◽  
Analysis Of Failures ◽  
Characterization Of Materials ◽  
Circuits Vlsi

Trends in the technology development of very large scale integrated circuits (VLSI) have been in the direction of higher density of components with smaller dimensions. The scaling down of device dimensions has been not only laterally but also in depth. Such efforts in miniaturization bring with them new developments in materials and processing. Successful implementation of these efforts is, to a large extent, dependent on the proper understanding of the material properties, process technologies and reliability issues, through adequate analytical studies. The analytical instrumentation technology has, fortunately, kept pace with the basic requirements of devices with lateral dimensions in the micron/ submicron range and depths of the order of nonometers. Often, newer analytical techniques have emerged or the more conventional techniques have been adapted to meet the more stringent requirements. As such, a variety of analytical techniques are available today to aid an analyst in the efforts of VLSI process evaluation. Generally such analytical efforts are divided into the characterization of materials, evaluation of processing steps and the analysis of failures.

1207: Failed Pyeloplasty in Children: Comparative Analysis of Retrograde Endopyelotomy VS. Re-do Pyeloplasty

2007 ◽  
Vol 177 (4S) ◽  
pp. 398-398
Author(s):  
Luis H. Braga ◽  
Joao L. Pippi Salle ◽  
Sumit Dave ◽  
Sean Skeldon ◽  
Armando J. Lorenzo ◽  
...  
Keyword(s):  
Comparative Analysis
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