A measurement method to mitigate temperature effects in nanometer CMOS RF power amplifiers

Author(s):  
Patrick Ossmann ◽  
Jorg Fuhrrnann ◽  
Jose Moreira ◽  
Harald Pretl ◽  
Andreas Springer
2008 ◽  
Vol 59 (1) ◽  
pp. 13-20 ◽  
Author(s):  
Patrick Reynaert ◽  
Michiel Steyaert

IEEE Access ◽  
2020 ◽  
Vol 8 ◽  
pp. 59200-59210
Author(s):  
Wen-Rao Fang ◽  
Wen-Hua Huang ◽  
Wen-Hui Huang ◽  
Chao Fu ◽  
Lu-Lu Wang ◽  
...  

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