Exploit Dynamic Voltage and Frequency Scaling for SoC Test Scheduling under Thermal Constraints

2014 ◽  
Author(s):  
Li Ling ◽  
Jianhui Jiang
Keyword(s):  
Test Scheduling ◽  
Frequency Scaling ◽  
Soc Test ◽  
Thermal Constraints ◽  
Dynamic Voltage

Thermal-aware SoC Test Scheduling with Voltage/Frequency Scaling and Test Partition

2018 ◽  
Vol 34 (4) ◽  
pp. 447-460 ◽  
Author(s):  
Ying Zhang ◽  
Li Ling ◽  
Jianhui Jiang ◽  
Jie Xiao
Keyword(s):  
Test Scheduling ◽  
Frequency Scaling ◽  
Soc Test ◽  
Voltage Frequency
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