A Multi-dimensional Pattern Run-Length Method for Test Data Compression

2009 ◽  
Author(s):  
Lung-Jen Lee ◽  
Wang-Dauh Tseng ◽  
Rung-Bin Lin ◽  
Chen-Lun Lee
Keyword(s):  
Data Compression ◽  
Test Data ◽  
Test Data Compression ◽  
Run Length

$2^{n}$ Pattern Run-Length for Test Data Compression

2012 ◽  
Vol 31 (4) ◽  
pp. 644-648 ◽  
Author(s):  
Lung-Jen Lee ◽  
Wang-Dauh Tseng ◽  
Rung-Bin Lin ◽  
Cheng-Ho Chang
Keyword(s):  
Data Compression ◽  
Test Data ◽  
Test Data Compression ◽  
Run Length

Test data compression using alternating variable run-length code

Integration ◽  
2011 ◽  
Vol 44 (2) ◽  
pp. 103-110 ◽  
Author(s):  
Bo Ye ◽  
Qian Zhao ◽  
Duo Zhou ◽  
Xiaohua Wang ◽  
Min Luo
Keyword(s):  
Data Compression ◽  
Test Data ◽  
Test Data Compression ◽  
Run Length ◽  
Length Code

2n Pattern run-length for test data compression

2010 ◽  
Author(s):  
Cheng-Ho Chang ◽  
Lung-Jen Lee ◽  
Wang-Dauh Tseng ◽  
Rung-Bin Lin
Keyword(s):  
Data Compression ◽  
Test Data ◽  
Test Data Compression ◽  
Run Length

Test data compression using extended frequency-directed run length code based on compatibility

2010 ◽  
Vol 46 (6) ◽  
pp. 404 ◽  
Author(s):  
M.Y. Wan ◽  
Y. Ding ◽  
Y. Pan ◽  
S. Zhou ◽  
X.L. Yan
Keyword(s):  
Data Compression ◽  
Test Data ◽  
Test Data Compression ◽  
Run Length ◽  
Extended Frequency ◽  
Length Code

scholarly journals Run-Length-Based Test Data Compression Techniques: How Far from Entropy and Power Bounds?—A Survey

VLSI Design ◽  
2010 ◽  
Vol 2010 ◽  
pp. 1-9 ◽  
Author(s):  
Usha S. Mehta ◽  
Kankar S. Dasgupta ◽  
Niranjan M. Devashrayee
Keyword(s):  
Data Compression ◽  
Test Data ◽  
Peak Power ◽  
Test Data Compression ◽  
Test Power ◽  
Current Generation ◽  
Run Length ◽  
Coding Schemes ◽  
Entropy Bounds ◽  
Ip Cores

The run length based coding schemes have been very effective for the test data compression in case of current generation SoCs with a large number of IP cores. The first part of paper presents a survey of the run length based codes. The data compression of any partially specified test data depends upon how the unspecified bits are filled with 1s and 0s. In the second part of the paper, the five different approaches for “don't care” bit filling based on nature of runs are proposed to predict the maximum compression based on entropy. Here the various run length based schemes are compared with maximum data compression limit based on entropy bounds. The actual compressions claimed by the authors are also compared. For various ISCAS circuits, it has been shown that when the X filling is done considering runs of zeros followed by one as well as runs of ones followed by zero (i.e., Extended FDR), it provides the maximum data compression. In third part, it has been shown that the average test power and peak power is minimum when the don't care bits are filled to make the long runs of 0s as well as 1s.

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