Human based knowledge for the probe failure pattern classification with the use of a backpropagation neural network. Application on submicron linear technologies
2010 ◽
Vol 31
(2)
◽
pp. 89-108
◽
1998 ◽
Vol 166
(3-4)
◽
pp. 233-246
◽
Keyword(s):
2019 ◽
Vol 20
(4)
◽
pp. 593-607
◽