Spatial yield modeling for semiconductor wafers

Proceedings of SEMI Advanced Semiconductor Manufacturing Conference and Workshop ◽

10.1109/asmc.1995.484386 ◽

2002 ◽

Cited By ~ 8

Author(s):

A.I. Mirza ◽

G. O'Donoghue ◽

A.W. Drake ◽

S.C. Graves

Keyword(s):

Yield Modeling

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Accounting for Conceptual Soil Erosion and Sediment Yield Modeling Uncertainty in the APEX Model Using Bayesian Model Averaging

Journal of Hydrologic Engineering ◽

10.1061/(asce)he.1943-5584.0001119 ◽

2015 ◽

Vol 20 (6) ◽

Cited By ~ 2

Author(s):

X. Wang ◽

H. Yen ◽

J. Jeong ◽

J. R. Williams

Keyword(s):

Soil Erosion ◽

Sediment Yield ◽

Bayesian Model ◽

Bayesian Model Averaging ◽

Model Averaging ◽

Modeling Uncertainty ◽

Yield Modeling ◽

Apex Model

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Statistical Metrology, with Applications to Interconnect and Yield Modeling

Handbook of Silicon Semiconductor Metrology ◽

10.1201/9780203904541.ch24 ◽

2001 ◽

Cited By ~ 2

Author(s):

Duane Boning

Keyword(s):

Yield Modeling

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A framework for extracting defect density information for yield modeling from in-line defect inspection for real-time prediction of random defect limited yields

1999 IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings (Cat No.99CH36314) ◽

10.1109/issm.1999.808821 ◽

2003 ◽

Cited By ~ 2

Author(s):

J. Segal ◽

A. Gordon ◽

D. Sajoto ◽

B. Duffy ◽

M. Kumar

Keyword(s):

Real Time ◽

Defect Density ◽

Line Defect ◽

Defect Inspection ◽

Time Prediction ◽

Yield Modeling ◽

Random Defect

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Potato yield modeling based on meteorological factors using discriminant analysis and artificial neural networks

International Journal of Vegetable Science ◽

10.1080/19315260.2021.2021342 ◽

2021 ◽

pp. 1-12

Author(s):

Akhilesh Kumar Gupta ◽

Kader Ali Sarkar ◽

Debasis Bhattacharya ◽

Digvijay Singh Dhakre

Keyword(s):

Neural Networks ◽

Artificial Neural Networks ◽

Discriminant Analysis ◽

Meteorological Factors ◽

Potato Yield ◽

Yield Modeling ◽

Artificial Neural

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Computerized Yield Modeling

Emerging Semiconductor Technology ◽

10.1520/stp25779s ◽

2008 ◽

pp. 404-404-10

Author(s):

CH Beck

Keyword(s):

Yield Modeling

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Neural Network Model for Oil Palm Yield Modeling

Journal of Applied Sciences ◽

10.3923/jas.2006.391.399 ◽

2006 ◽

Vol 6 (2) ◽

pp. 391-399 ◽

Cited By ~ 7

Author(s):

Azme Khamis ◽

Zuhaimy Ismail . ◽

Khalid Haron . ◽

Ahmad Tarmizi Mohamm .

Keyword(s):

Neural Network ◽

Network Model ◽

Neural Network Model ◽

Oil Palm ◽

Yield Modeling

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DT Neutron Yield Modeling for Staged Z-Pinch Experiments on the 1MA Zebra Machine*

2017 IEEE International Conference on Plasma Science (ICOPS) ◽

10.1109/plasma.2017.8496088 ◽

2017 ◽

Author(s):

E. Ruskov ◽

H. U. Rahman ◽

F. J. Wessel ◽

P. Ney ◽

A. Qerushi

Keyword(s):

Neutron Yield ◽

Yield Modeling ◽

Z Pinch

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Suspended sediment yield modeling in Mahanadi River, India by multi-objective optimization hybridizing artificial intelligence algorithms

International Journal of Sediment Research ◽

10.1016/j.ijsrc.2020.03.018 ◽

2021 ◽

Vol 36 (1) ◽

pp. 76-91 ◽

Cited By ~ 1

Author(s):

Arvind Yadav ◽

Snehamoy Chatterjee ◽

Sk Md Equeenuddin

Keyword(s):

Artificial Intelligence ◽

Suspended Sediment ◽

Sediment Yield ◽

Multi Objective Optimization ◽

Mahanadi River ◽

Multi Objective ◽

Suspended Sediment Yield ◽

Yield Modeling

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Yield-modeling accuracy requirements for 300-mm processing

10.1117/12.324382 ◽

1998 ◽

Author(s):

Daren L. Dance ◽

Christopher W. Long

Keyword(s):

Yield Modeling ◽

Modeling Accuracy

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Parametric Yield Modeling Using Hidden Variable Logistic Regression

Journal of Quality Technology ◽

10.1080/00224065.2014.11917975 ◽

2014 ◽

Vol 46 (4) ◽

pp. 323-339 ◽

Cited By ~ 2

Author(s):

Jung Yoon Hwang ◽

Hyun Cheol Lee

Keyword(s):

Logistic Regression ◽

Hidden Variable ◽

Parametric Yield ◽

Yield Modeling

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