The phase distribution in rough surface scatter for finite distances between transmitter and receiver

Author(s):  
P. Beckmann
1974 ◽  
Vol 55 (S1) ◽  
pp. S66-S66
Author(s):  
J. G. Zornig ◽  
J. F. McDonald

Author(s):  
Samuel D. Butler ◽  
Michael A. Marciniak ◽  
Mark F. Spencer ◽  
Ann Lanari

Wear ◽  
1986 ◽  
Vol 109 (1-4) ◽  
pp. 43-56 ◽  
Author(s):  
F. Sweeney ◽  
T.A. Spedding

1970 ◽  
Vol 48 (1A) ◽  
pp. 128-128
Author(s):  
P. J. Lynch ◽  
R. J. Wagner

Author(s):  
S. Hasegawa ◽  
T. Kawasaki ◽  
J. Endo ◽  
M. Futamoto ◽  
A. Tonomura

Interference electron microscopy enables us to record the phase distribution of an electron wave on a hologram. The distribution is visualized as a fringe pattern in a micrograph by optical reconstruction. The phase is affected by electromagnetic potentials; scalar and vector potentials. Therefore, the electric and magnetic field can be reduced from the recorded phase. This study analyzes a leakage magnetic field from CoCr perpendicular magnetic recording media. Since one contour fringe interval corresponds to a magnetic flux of Φo(=h/e=4x10-15Wb), we can quantitatively measure the field by counting the number of finges. Moreover, by using phase-difference amplification techniques, the sensitivity for magnetic field detection can be improved by a factor of 30, which allows the drawing of a Φo/30 fringe. This sensitivity, however, is insufficient for quantitative analysis of very weak magnetic fields such as high-density magnetic recordings. For this reason we have adopted “fringe scanning interferometry” using digital image processing techniques at the optical reconstruction stage. This method enables us to obtain subfringe information recorded in the interference pattern.


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