Applied of look up table controller based of FLC (fuzzy logic controller) in non-linear system AFM (atomic force microscopy)/PSTM (photon scanning tunnel microscope)

2003 ◽  
Author(s):  
S. Ari ◽  
B. Belier ◽  
M. Nuh ◽  
A. Jazidie ◽  
M. Rameli ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Fuzzy Logic ◽  
Linear System ◽  
Fuzzy Logic Controller ◽  
Scanning Tunnel Microscope ◽  
Force Microscopy ◽  
Atomic Force ◽  
Look Up Table ◽  
Non Linear ◽  
Non Linear System

Force Feedback in Dynamic Atomic Force Microscopy

2005 ◽  
Author(s):  
R. W. Stark
Keyword(s):  
Atomic Force Microscopy ◽  
Quality Factor ◽  
Time Delays ◽  
Force Feedback ◽  
Feedback Signal ◽  
Detection Scheme ◽  
Force Microscopy ◽  
Atomic Force ◽  
Non Linear ◽  
Non Linear System

The feedback perspective of dynamic AFM provides a powerful tool to investigate the non-linear system dynamics from a system theoretic point of view. Including the higher order dynamics of the extended cantilever beam in the model the contact resonances can be reproduced faithfully without the need to solve the partial differential equation of motion directly. The investigation of the non-linear dynamics provides valuable insight into the generation of higher harmonics in dynamic AFM. However, the light lever detection scheme is widely used in dynamic AFM. This means that — strictly speaking — the tip-deflection is not a measurable quantity: the local deflection angle is measured but not the deflection itself. Additionally, time-delays may be introduced into the system influencing the dynamic behavior. Apart from system inherent time delays, a delayed force feedback is often used in order manipulate the system’s resonance characteristics (quality factor). Such an active control of the oscillatory behavior of the cantilever used in atomic force microscopy (AFM) allows one to tune the quality factor to purpose. For experiments requiring a high force sensitivity an enhancement of the quality factor is desirable whereas in time critical experiments additional damping may be needed. In order to control the quality factor a feedback signal is used that approximates the time derivative of the system state within the bandwidth of interest.

Calibration of Non Linear Properties of Pb(Zr, Ti)O3Cantilever Using Integrated Piezoresistive Sensor for High Speed Atomic Force Microscopy

2002 ◽  
Vol 41 (Part 1, No. 11B) ◽  
pp. 7153-7157 ◽  
Author(s):  
Hyo-Jin Nam ◽  
Young-Sik Kim ◽  
Seong-Moon Cho ◽  
Caroline Sunyong Lee ◽  
Jong-Uk Bu ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
High Speed ◽  
Force Microscopy ◽  
Atomic Force ◽  
Piezoresistive Sensor ◽  
Non Linear

Fuzzy logic algorithm to extract specific interaction forces from atomic force microscopy data

2000 ◽  
Vol 71 (5) ◽  
pp. 2082-2086 ◽  
Author(s):  
Sandor Kasas ◽  
Beat M. Riederer ◽  
Stefan Catsicas ◽  
Brunero Cappella ◽  
Giovanni Dietler
Keyword(s):  
Atomic Force Microscopy ◽  
Fuzzy Logic ◽  
Specific Interaction ◽  
Atomic Force Microscopy Data ◽  
Interaction Forces ◽  
Fuzzy Logic Algorithm ◽  
Force Microscopy ◽  
Atomic Force ◽  
Microscopy Data

Analysis of atomic force microscopy data for surface characterization using fuzzy logic

2011 ◽  
Vol 62 (7) ◽  
pp. 706-715 ◽  
Author(s):  
Amjed Al-Mousa ◽  
Darrell L. Niemann ◽  
Devin J. Niemann ◽  
Norman G. Gunther ◽  
Mahmud Rahman
Keyword(s):  
Atomic Force Microscopy ◽  
Fuzzy Logic ◽  
Surface Characterization ◽  
Atomic Force Microscopy Data ◽  
Force Microscopy ◽  
Atomic Force ◽  
Microscopy Data
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