Two axis image-based measurement and control for scanning probe microscopes

Author(s):  
G. M. Clayton ◽  
B. McManus
Author(s):  
Andrew C. Miner ◽  
Michael Chapp ◽  
Deyu Li ◽  
Arun Majumdar

This work brings together aspects of scanning thermal microscopy (SThM) and scanning spreading resistance microscopy (SRM) into a single tool for thermoelectric measurement. The measurement tool presented here allows simultaneous electrical and thermal measurement of samples using a probe tip of radius on the order of 50 nm. Thermal and mechanical design allow topographic resolution on the order of 4Å while minimizing detrimental heat flow from the probe to sample. This tool integrates sensors allowing for heat flux measurement and control, enabling a variety of thermal, electrical and thermoelectric measurements. Preliminary thermal and electrical measurements of bismuth telluride nanowire arrays demonstrate the capabilities of this scanning probe design.


2001 ◽  
Author(s):  
G. Mainelis ◽  
R. Gorny ◽  
K. Willeke ◽  
S. Grinshpun ◽  
T. Reponen ◽  
...  

2013 ◽  
Vol 62 (1) ◽  
pp. 23-31 ◽  
Author(s):  
Maria Mrówczyńska

Abstract The paper attempts to determine an optimum structure of a directional measurement and control network intended for investigating horizontal displacements. For this purpose it uses the notion of entropy as a logarithmical measure of probability of the state of a particular observation system. An optimum number of observations results from the difference of the entropy of the vector of parameters ΔHX̂ (x)corresponding to one extra observation. An increment of entropy interpreted as an increment of the amount of information about the state of the system determines the adoption or rejection of another extra observation to be carried out.


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