scholarly journals Optimal Parameter Design for IC Wire Bonding Process by Using Fuzzy Logic and Taguchi Method

IEEE Access ◽  
2016 ◽  
Vol 4 ◽  
pp. 3034-3045 ◽  
Author(s):  
Jinn-Tsong Tsai ◽  
Cheng-Chung Chang ◽  
Wen-Ping Chen ◽  
Jyh-Horng Chou
Keyword(s):  
Fuzzy Logic ◽  
Taguchi Method ◽  
Optimal Parameter ◽  
Wire Bonding ◽  
Bonding Process ◽  
Parameter Design

Study on the Optimal Parameter Design of Gas-insulated DC Relay Systems Based on Taguchi Method

2020 ◽  
Vol 69 (2) ◽  
pp. 375-380
Author(s):  
Ho Jun Lee ◽  
Young Kook Kim ◽  
Woo Jin Jo ◽  
Chang-Seop Koh ◽  
Kilyoung Ahn ◽  
...  
Keyword(s):  
Taguchi Method ◽  
Optimal Parameter ◽  
Parameter Design ◽  
Relay Systems

scholarly journals Optimal Parameter Design by NSGA-II and Taguchi Method for RCD Snubber Circuit

IEEE Access ◽  
2020 ◽  
Vol 8 ◽  
pp. 182146-182158
Author(s):  
Ying Ma ◽  
Fu-I Chou ◽  
Po-Yuan Yang ◽  
Jinn-Tsong Tsai ◽  
Zhen-Yu Yang ◽  
...  
Keyword(s):  
Taguchi Method ◽  
Optimal Parameter ◽  
Parameter Design ◽  
Nsga Ii ◽  
Snubber Circuit

Failure Analysis on Power Trench MOSFET Devices with Copper Wire Bonds

2011 ◽  
Author(s):  
Huixian Wu ◽  
Arthur Chiang ◽  
David Le ◽  
Win Pratchayakun
Keyword(s):  
Failure Analysis ◽  
Copper Wire ◽  
New Technology ◽  
Analytical Techniques ◽  
Wire Bonding ◽  
Bonding Process ◽  
Wire Bonds ◽  
Copper Wire Bonding ◽  
Wet Chemical ◽  
Microelectronic Components

Abstract With gold prices steadily going up in recent years, copper wire has gained popularity as a means to reduce cost of manufacturing microelectronic components. Performance tradeoff aside, there is an urgent need to thoroughly study the new technology to allay any fear of reliability compromise. Evaluation and optimization of copper wire bonding process is critical. In this paper, novel failure analysis and analytical techniques are applied to the evaluation of copper wire bonding process. Several FA/analytical techniques and FA procedures will be discussed in detail, including novel laser/chemical/plasma decapsulation, FIB, wet chemical etching, reactive ion etching (RIE), cross-section, CSAM, SEM, EDS, and a combination of these techniques. Two case studies will be given to demonstrate the use of these techniques in copper wire bonded devices.

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