Determination of aging-model constants under high frequency and high electric fields

1994 ◽  
Vol 1 (6) ◽  
pp. 1034-1038 ◽  
Author(s):  
W. Khachen ◽  
J.R. Laghari
Keyword(s):  
Electric Fields ◽  
High Frequency ◽  
Aging Model ◽  
High Electric Fields

Experimental determination of the dipole moments of the X(2Σ+) and B(2Σ+) states of the CN molecule

1968 ◽  
Vol 46 (24) ◽  
pp. 2815-2819 ◽  
Author(s):  
Ritchie Thomson ◽  
F. W. Dalby
Keyword(s):  
Emission Spectrum ◽  
Experimental Determination ◽  
Electric Fields ◽  
Dipole Moments ◽  
High Electric Fields

From observation of the electronic emission spectrum in high electric fields, the dipole moments of the X(2Σ+) and B(2Σ+) states of the CN molecule have been determined to be 1.45 ± 0.08 and 1.15 ± 0.08 debye, respectively. The relative signs of the dipole moments in these two states are shown to be opposite.

scholarly journals On determination of the permittivity through the module of the vector of the electric strength of the high-frequency electromagnetic field

2019 ◽  
Vol 484 (3) ◽  
pp. 269-272
Author(s):  
V. G. Romanov
Keyword(s):  
Inverse Problem ◽  
Electric Fields ◽  
High Frequency ◽  
Inverse Kinematic ◽  
Point Sources ◽  
Electric Strength ◽  
Inverse Kinematic Problem ◽  
High Frequency Electromagnetic Field ◽  
The Given

For nonmagnetic and nonconductive medium the system of electrodynamic equations that corresponds to periodic in time oscillations is considered. An inverse problem of determining permittivity in this system by the given module of the electric strength is studied. It is supposed that the electric fields is a result of the interference of two fields created by point sources. The permittivity e(x) is assumed to be differ from a given positive constant e0 inside of a compact domain W0 Ì R3 only. An information on module of the electric strength is given on the boundary of the domain W contained W0 inside itself and for all frequencies beginning with some fixed frequency w0. The asymptotic behavior of solution of a direct problem related to the electrodynamic equations is studied and the original inverse problem is reduced to the well known inverse kinematic problem. This reduction open a way for constructive solution of the inverse phaseless problem.

scholarly journals Sensor of high frequency electric fields intensity on the base of slot waveguides with electro-optic polymer filling

2020 ◽  
Vol 4 (4) ◽  
pp. 378-388
Author(s):  
Игорь Андреевич Гончаренко ◽  
Виталий Николаевич Рябцев ◽  
Александр Васильевич Ильюшонок ◽  
Олег Дмитриевич Навроцкий
Keyword(s):  
Electric Field ◽  
Electric Fields ◽  
Optical Sensor ◽  
High Frequency ◽  
Method Of Lines ◽  
Application Field ◽  
Optical Polymer ◽  
Electro Optic ◽  
Slot Waveguides

Purpose. Development of the structure and operation principles of high frequency electric fields intensity optical sensor. Methods. Method of lines was used for calculation of propagation constants and mode electric fields distribution of strip waveguides with vertical and horizontal slots filled with electro-optical polymer SEO125. Findings. The structure and operation principles of high frequency electric fields intensity sensor on the base of slot waveguides with vertical and horizontal slots filled with electro-optical polymer are proposed. Sensor makes it possible measuring the variable electric fields with frequencies up to 10 MHz. The sensor sensitivity order is of 30 V/m. Application field of research. Determination of fire-dangerous and injurious factors of electric field during emergencies elimination.

Novel Thermal-Electrical-Mechanical Model for Simulating Coupled Phenomena in High-Frequency Electronic Devices

2013 ◽  
Vol 538 ◽  
pp. 173-176
Author(s):  
Jing Zhang
Keyword(s):  
Finite Element ◽  
Electric Fields ◽  
High Frequency ◽  
Electronic Devices ◽  
High Stress ◽  
Element Model ◽  
Wide Bandgap ◽  
Operating Conditions ◽  
Element Approach ◽  
High Electric Fields

We present a fully coupled thermal-electrical-mechanical finite element based model to study material degradation behaviors of high-frequency electronic devices. The mechanisms of degradation and ultimately failure in wide bandgap (WBG) devices are very complex. Under operating conditions, the devices are usually subject to high electric fields, high stress/strain fields, high current densities, high temperatures and high thermal gradients. Moreover, these phenomena are coupled together. The presented finite element model is capable of computing stress, temperature, and electric fields based on an innovative finite element approach for the solution of non-linear coupled thermal-electrical-mechanical problems. The model can be applied to wide bandgap electronic devices to address major issues of performance and lifetime.

Zur Bestimmung des Fano-Faktors von Ge(Li)-Detektoren

1966 ◽  
Vol 21 (12) ◽  
pp. 2083-2088 ◽  
Author(s):  
Ingolf Ruge ◽  
Peter Eichinger
Keyword(s):  
Electric Fields ◽  
Fano Factor ◽  
Theoretical Limit ◽  
Exact Determination ◽  
High Gamma ◽  
High Electric Fields ◽  
Set Up ◽  
Very High ◽  
Collection Time

Within the last two years the FANO factor F for Ge (Li)-detectors, which defines the theoretical limit for the resolution in the area of spectroscopy in regard to the detector, was found out experimentally several times. The values obtained for F vary between 0.7 and 0.15. In order to find out the reasons for these variations the dependence of the energy resolution on the electric field was examined at various gamma-energies for several Ge (Li)-detectors. Even at very high electric fields (several kilovolts/cm) still a field dependence especially at high gamma-energies appeared, which could be explained in terms of charge collection time. As condition for an exact determination of the FANO factor the extrapolation of the resolution to field strength infinity is set up; with this method the value of the FANO factor for Ge (Li)-detectors, used here, was estimated to 0.20 ±0.05.

An experimental determination of the dipole moments of the X(1Σ) and A(1Π) states of the BH molecule

1969 ◽  
Vol 47 (11) ◽  
pp. 1155-1158 ◽  
Author(s):  
Ritchie Thomson ◽  
F. W. Dalby
Keyword(s):  
Emission Spectrum ◽  
Experimental Determination ◽  
Electric Fields ◽  
Discharge Tube ◽  
Dipole Moments ◽  
Optical Emission ◽  
Optical Emission Spectrum ◽  
Stark Effects ◽  
High Electric Fields

The optical emission spectrum of the BH radical produced in a discharge tube designed to give high electric fields shows Stark effects. From these, the dipole moments of the X(1Σ+) and A(1Π) states are determined to be (1.27 ± 0.21) D and (0.58 ± 0.04) D, respectively.

Precise determination of nonlinear function of ion mobility for explosives and drugs at high electric fields for microchip FAIMS

2015 ◽  
Vol 50 (1) ◽  
pp. 198-205 ◽  
Author(s):  
Dapeng Guo ◽  
Yonghuan Wang ◽  
Lingfeng Li ◽  
Xiaozhi Wang ◽  
Jikui Luo
Keyword(s):  
Electric Fields ◽  
Ion Mobility ◽  
Nonlinear Function ◽  
Precise Determination ◽  
High Electric Fields

Atomic Spectroscopy in the FIM

1986 ◽  
Vol 44 ◽  
pp. 758-761
Author(s):  
J. J. Hren ◽  
S. D. Walck
Keyword(s):  
Electron Microscope ◽  
Electric Fields ◽  
Atom Probe ◽  
Atomic Spectroscopy ◽  
Single Atom ◽  
Statistical Sampling ◽  
Commercial Instrument ◽  
Available Technology ◽  
High Electric Fields ◽  
Field Ion Microscope

The field ion microscope (FIM) has had the ability to routinely image the surface atoms of metals since Mueller perfected it in 1956. Since 1967, the TOF Atom Probe has had single atom sensitivity in conjunction with the FIM. “Why then hasn't the FIM enjoyed the success of the electron microscope?” The answer is closely related to the evolution of FIM/Atom Probe techniques and the available technology. This paper will review this evolution from Mueller's early discoveries, to the development of a viable commercial instrument. It will touch upon some important contributions of individuals and groups, but will not attempt to be all inclusive. Variations in instrumentation that define the class of problems for which the FIM/AP is uniquely suited and those for which it is not will be described. The influence of high electric fields inherent to the technique on the specimens studied will also be discussed. The specimen geometry as it relates to preparation, statistical sampling and compatibility with the TEM will be examined.

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