Analysis of phase-focused near-field testing for multiphase-center adaptive radar systems

1992 ◽  
Vol 40 (8) ◽  
pp. 878-887 ◽  
Author(s):  
A.J. Fenn
Keyword(s):  
Near Field ◽  
Field Testing ◽  
Adaptive Radar ◽  
Radar Systems

Near field testing on ACTS breadboard multibeam antenna (MBA)

2003 ◽  
Author(s):  
C.H. Chen ◽  
W.C. Wong ◽  
S.J. Hamada
Keyword(s):  
Near Field ◽  
Field Testing ◽  
Multibeam Antenna

scholarly journals Near-Field Immunity Test Method for Fast Radiated Immunity Test Debugging of Automotive Electronics

Electronics ◽  
2019 ◽  
Vol 8 (7) ◽  
pp. 797 ◽  
Author(s):  
Jawad Yousaf ◽  
Doojin Lee ◽  
JunHee Han ◽  
Hosang Lee ◽  
Muhammad Faisal ◽  
...  
Keyword(s):  
Automotive Industry ◽  
Near Field ◽  
Cost Effective ◽  
Field Testing ◽  
Input Power ◽  
Test Method ◽  
Automotive Electronics ◽  
Test Results ◽  
Electric Power Steering ◽  
Power Steering

This study presents a near-field immunity test (NFIT) method for the fast debugging of radiated susceptibility of industrial devices. The proposed approach is based on the development of an NFIT setup which comprises of developed near-field electric and magnetic field probes and device under test (DUT). The developed small-size and handy near-field testing probes inject the high electric (up to 1000 V/m) and magnetic (up to 2.4 A/m) fields on the DUT in the radar pulse ranges (1.2 to 1.4 GHz and 2.7 to 3.1 GHz) with the lower fed input power (up to 15 W) from the power amplifier in the developed NFIT setup. The proof of concept is validated with the successful near-field immunity debugging of an electric power steering (EPS) device used in the automotive industry with the developed NFIT setup. The radiated susceptibility debugging test results of developed NFIT method and conventional method of ISO 11452-2 test setup turned out to be close to each other for the tested DUT in immunity performance. The proposed procedure has advantages of industry usefulness with fast, handy, and cost-effective radiated immunity debugging of the DUT without the requirement of large antenna, high-power amplifiers, optical DUT connecting harness, and an anechoic chamber as needed in ISO 11452-2 standard setup for the debugging analysis.

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