High-resolution measurement of the fiber diameter variations using whispering gallery modes and no optical alignment

2000 ◽  
Vol 12 (2) ◽  
pp. 182-183 ◽  
Author(s):  
T.A. Birks ◽  
J.C. Knight ◽  
T.E. Dimmick
1989 ◽  
Vol 33 ◽  
pp. 83-90 ◽  
Author(s):  
M. Fatemi

AbstractA simple method for high-resolution measurement of surface misorientation in electronic materials is introduced. The technique combines laser optical alignment with double-crystal x-ray diffraction to yield a typical sensitivity of better than 1-2 arc sec. The technique can also be used to make corrections in spectrometric measurements in which commonly ignored rocking - curve errors may be significant.


1994 ◽  
Vol 4 (4) ◽  
pp. 215-219
Author(s):  
P. Kindl ◽  
B. Obenaus ◽  
Kh. Feichtinger ◽  
G. Stuecklschweiger

1982 ◽  
Vol 21 (10) ◽  
pp. 1785 ◽  
Author(s):  
H. Nishihara ◽  
J. Koyama ◽  
N. Hoki ◽  
F. Kajiya ◽  
M. Hironaga ◽  
...  

2000 ◽  
Vol 71 (5) ◽  
pp. 2147-2153 ◽  
Author(s):  
A. Gauzzi ◽  
J. Le Cochec ◽  
G. Lamura ◽  
B. J. Jönsson ◽  
V. A. Gasparov ◽  
...  

1979 ◽  
Vol 20 (6) ◽  
pp. 2440-2448 ◽  
Author(s):  
J. A. Tanis ◽  
B. Budick ◽  
J. W. Kast ◽  
A. M. Rushton

2018 ◽  
Vol 5 (4) ◽  
pp. 105 ◽  
Author(s):  
Zhihui Zhang ◽  
David K. Heidary ◽  
Christopher I. Richards

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