An Extended Kalman filtering-based method of processing reflectometry data for fast in-situ etch rate measurements
1997 ◽
Vol 10
(1)
◽
pp. 42-51
◽
1987 ◽
Vol AES-23
(3)
◽
pp. 412-412
Keyword(s):
2007 ◽
Vol 1
(1)
◽
pp. 79-90
◽
Keyword(s):