Physical origin of long-term charge loss in floating-gate EPROM with an interpoly oxide-nitride-oxide stacked dielectric

C.-S. Pan; K. Wu; G. Sery

doi:10.1109/55.75700

Physical origin of long-term charge loss in floating-gate EPROM with an interpoly oxide-nitride-oxide stacked dielectric

IEEE Electron Device Letters ◽

10.1109/55.75700 ◽

1991 ◽

Vol 12 (2) ◽

pp. 51-53 ◽

Cited By ~ 23

Author(s):

C.-S. Pan ◽

K. Wu ◽

G. Sery

Keyword(s):

Floating Gate ◽

Physical Origin ◽

Charge Loss ◽

Interpoly Oxide ◽

Nitride Oxide

Download Full-text

High-temperature charge loss mechanism in a floating-gate EPROM with an oxide-nitride-oxide (ONO) interpoly stacked dielectric

IEEE Electron Device Letters ◽

10.1109/55.116933 ◽

1991 ◽

Vol 12 (9) ◽

pp. 506-503 ◽

Cited By ~ 17

Author(s):

C.-S. Pan ◽

K. Wu ◽

D. Chin ◽

G. Sery ◽

J. Kiely

Keyword(s):

High Temperature ◽

Floating Gate ◽

Loss Mechanism ◽

Charge Loss ◽

Nitride Oxide

Download Full-text

Long term charge loss in EPROMs with ONO interpoly dielectric

Proceedings of 1994 IEEE International Reliability Physics Symposium RELPHY-94 ◽

10.1109/relphy.1994.307811 ◽

1994 ◽

Cited By ~ 3

Author(s):

M.R. Hermann ◽

M. Ciappa ◽

A. Schenk

Keyword(s):

Charge Loss

Download Full-text

Physical description of anomalous charge loss in floating gate based NVM's and identification of its dominant parameter

2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) ◽

10.1109/relphy.2002.996606 ◽

2003 ◽

Cited By ~ 9

Author(s):

F. Schuler ◽

R. Degraeve ◽

P. Hendrickx ◽

D. Wellekens

Keyword(s):

Floating Gate ◽

Physical Description ◽

Charge Loss ◽

Dominant Parameter

Download Full-text

Effect of Ion Energy on Charge Loss From Floating Gate Memories

IEEE Transactions on Nuclear Science ◽

10.1109/tns.2008.2000779 ◽

2008 ◽

Vol 55 (4) ◽

pp. 2042-2047 ◽

Cited By ~ 12

Author(s):

Giorgio Cellere ◽

Alessandro Paccagnella ◽

Angelo Visconti ◽

Mauro Bonanomi ◽

Silvia Beltrami ◽

...

Keyword(s):

Floating Gate ◽

Ion Energy ◽

Charge Loss

Download Full-text

A sub-microwatt piezo-floating-gate sensor for long-term fatigue monitoring in biomechanical implants

2006 International Conference of the IEEE Engineering in Medicine and Biology Society ◽

10.1109/iembs.2006.260580 ◽

2006 ◽

Cited By ~ 2

Author(s):

Nizar Lajnef ◽

Shantanu Chakrabartty ◽

Niell Elvin ◽

Alex Elvin

Keyword(s):

Floating Gate ◽

Fatigue Monitoring ◽

Gate Sensor

Download Full-text

Scaling considerations of interpoly oxide-nitride-oxide dielectric for high-density DRAM applications

10.1117/12.250866 ◽

1996 ◽

Author(s):

Zhijian Ma ◽

Jeong Y. Choi ◽

Chuen-Der Lien

Keyword(s):

High Density ◽

Interpoly Oxide ◽

Nitride Oxide

Download Full-text

Clinical long-term outcome after implantation of titanium nitride-oxide coated stents compared with paclitaxel- or sirolimus-eluting stents: propensity-score matched analysis

EuroIntervention ◽

10.4244/eijv7i9a166 ◽

2012 ◽

Vol 7 (9) ◽

pp. 1043-1050 ◽

Cited By ~ 5

Author(s):

Andreas Limacher ◽

Lorenz Räber ◽

Eva Laube ◽

Annette Lauterburg ◽

Sylvan Lötscher ◽

...

Keyword(s):

Propensity Score ◽

Titanium Nitride ◽

Term Outcome ◽

Long Term Outcome ◽

Nitride Oxide

Download Full-text

A Model for EPROM Intrinsic Charge Loss Through Oxide-Nitride-Oxide (ONO) Interpoly Dielectric

10.1109/irps.1990.363513 ◽

1990 ◽

Cited By ~ 4

Author(s):

Ken Wu ◽

Cheng-Sheng Pan ◽

J.J. Shaw ◽

Philip Freiberger ◽

George Sery

Keyword(s):

Charge Loss ◽

Nitride Oxide

Download Full-text

Charge loss in metal-nitride-oxide-semiconductor (MNOS) devices at high temperatures

Solid-State Electronics ◽

10.1016/0038-1101(83)90098-9 ◽

1983 ◽

Vol 26 (5) ◽

pp. 427-432 ◽

Cited By ~ 4

Author(s):

C.S. Dobbs ◽

W.D. Brown ◽

J.R. Yeargan

Keyword(s):

High Temperatures ◽

Oxide Semiconductor ◽

Metal Nitride ◽

Charge Loss ◽

Nitride Oxide

Download Full-text

Design and use based on long-term measurements of analog floating-gate array circuits

The 2002 45th Midwest Symposium on Circuits and Systems, 2002. MWSCAS-2002. ◽

10.1109/mwscas.2002.1187215 ◽

2003 ◽

Author(s):

M. Kucic ◽

P. Hasler ◽

P. Smith

Keyword(s):

Floating Gate ◽

Gate Array

Download Full-text