Test generation for current testing (CMOS ICs)
1987 ◽
Vol 134
(2)
◽
pp. 69
◽
2020 ◽
Vol 64
(1-4)
◽
pp. 621-629
Keyword(s):
2020 ◽
Vol 64
(1-4)
◽
pp. 47-55
Keyword(s):
2016 ◽
Vol 136
(3)
◽
pp. 423-433
Keyword(s):