Electro-optic sampling system for the testing of high-speed integrated circuits using a free running solid-state laser
1996 ◽
Vol 14
(8)
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pp. 1788-1793
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2009 ◽
Vol 19
(4)
◽
pp. 254-256
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Keyword(s):
Keyword(s):
Keyword(s):
Keyword(s):
Keyword(s):