Worst case tolerance analysis and CLP-based multifrequency test generation for analog circuits
1999 ◽
Vol 18
(3)
◽
pp. 332-345
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2000 ◽
Vol 47
(8)
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pp. 1138-1145
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2001 ◽
Vol 48
(10)
◽
pp. 1265-1267
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1987 ◽
Vol 109
(2)
◽
pp. 112-116
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Keyword(s):
2007 ◽
Vol 1
(4)
◽
pp. 353
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Keyword(s):