Testing reconfigured RAM's and scrambled address RAM's for pattern sensitive faults

M. Franklin; K.K. Saluja

doi:10.1109/43.536714

Testing reconfigured RAM's and scrambled address RAM's for pattern sensitive faults

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.536714 ◽

1996 ◽

Vol 15 (9) ◽

pp. 1081-1087 ◽

Cited By ~ 11

Author(s):

M. Franklin ◽

K.K. Saluja

Keyword(s):

Pattern Sensitive Faults

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Multi-Run March Tests for Pattern Sensitive Faults in RAM

2018 IEEE East-West Design & Test Symposium (EWDTS) ◽

10.1109/ewdts.2018.8524643 ◽

2018 ◽

Author(s):

Eugenia Buslowska ◽

Vyacheslav Yarmolik

Keyword(s):

Pattern Sensitive Faults ◽

March Tests

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A Graph Model for Pattern-Sensitive Faults in Random Access Memories

IEEE Transactions on Computers ◽

10.1109/tc.1981.1675737 ◽

1981 ◽

Vol C-30 (12) ◽

pp. 973-977 ◽

Cited By ~ 13

Author(s):

Seth ◽

Narayanaswamy

Keyword(s):

Random Access ◽

Graph Model ◽

Pattern Sensitive Faults

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Testing ternary content addressable memories with active neighbourhood pattern-sensitive faults

IET Computers & Digital Techniques ◽

10.1049/iet-cdt:20060134 ◽

2007 ◽

Vol 1 (3) ◽

pp. 246 ◽

Cited By ~ 9

Author(s):

Y.-J. Huang ◽

J.-F. Li

Keyword(s):

Content Addressable Memories ◽

Pattern Sensitive Faults

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A synthesizable ram bist circuit for applying an O(n log/sub 2/ n) test that detects scrambled static pattern-sensitive faults

IEEE International Workshop on Memory Technology, Design and Testing, ◽

10.1109/mtdt.1996.782493 ◽

2005 ◽

Cited By ~ 5

Author(s):

B.F. Cockburn ◽

D.P. Sarda

Keyword(s):

Pattern Sensitive Faults ◽

Static Pattern

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AN ALGORITHM TO TEST RAMS FOR PHYSICAL NEIGHBORHOOD PATTERN SENSITIVE FAULTS

1991, Proceedings. International Test Conference ◽

10.1109/test.1991.519732 ◽

2005 ◽

Cited By ~ 13

Author(s):

M. Franklin ◽

K.K. Saluja

Keyword(s):

Pattern Sensitive Faults

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Pseudorandom Testing of RAM for Pattern-Sensitive Faults

Transactions of the Society of Instrument and Control Engineers ◽

10.9746/sicetr1965.26.16 ◽

1990 ◽

Vol 26 (1) ◽

pp. 16-23

Author(s):

Gururaj K. RAO ◽

Hiroshi KASHIWAGI

Keyword(s):

Pattern Sensitive Faults

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March Test for Static Neighborhood Pattern-Sensitive Faults in Random-Access Memories

Elektronika ir Elektrotechnika ◽

10.5755/j01.eee.119.3.1369 ◽

2012 ◽

Vol 119 (3) ◽

Cited By ~ 3

Author(s):

C. Huzum ◽

P. Cascaval

Keyword(s):

Random Access ◽

March Test ◽

Pattern Sensitive Faults

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Testing of Neighborhood Pattern-Sensitive Faults for Memory

Advances in Intelligent Systems and Computing - Soft Computing and Signal Processing ◽

10.1007/978-981-16-1249-7_59 ◽

2021 ◽

pp. 631-638

Author(s):

K. L. V. Ramana Kumari ◽

M. Asha Rani ◽

N. Balaji

Keyword(s):

Pattern Sensitive Faults

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Test Procedures for a Class of Pattern-Sensitive Faults in Semiconductor Random-Access Memories

IEEE Transactions on Computers ◽

10.1109/tc.1980.1675601 ◽

1980 ◽

Vol C-29 (6) ◽

pp. 419-429 ◽

Cited By ~ 85

Author(s):

Suk ◽

Reddy

Keyword(s):

Random Access ◽

Test Procedures ◽

Pattern Sensitive Faults

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Transparent random access memory testing for pattern sensitive faults

Journal of Electronic Testing ◽

10.1007/bf00134690 ◽

1996 ◽

Vol 9 (3) ◽

pp. 251-266 ◽

Cited By ~ 3

Author(s):

M. G. Karpovsky ◽

V. N. Yarmolik

Keyword(s):

Random Access ◽

Random Access Memory ◽

Memory Testing ◽

Access Memory ◽

Pattern Sensitive Faults

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