Slotted surface treatment of position-sensitive NaI(Tl) detectors to improve detector performance

2001 ◽  
Vol 48 (6) ◽  
pp. 2418-2423 ◽  
Author(s):  
S. Surti ◽  
R. Freifelder ◽  
J.S. Karp
Keyword(s):  
Surface Treatment ◽  
Detector Performance ◽  
Position Sensitive ◽  
Improve Detector

THE DETECTION OF GRAVITATIONAL WAVES

1996 ◽  
Vol 05 (02) ◽  
pp. 101-150 ◽  
Author(s):  
L. JU ◽  
D.G. BLAIR
Keyword(s):  
Gravitational Waves ◽  
Galaxy Formation ◽  
Laser Interferometer ◽  
New Materials ◽  
Noise Sources ◽  
Detector Performance ◽  
Wave Detection ◽  
New Methods ◽  
Stochastic Background ◽  
Improve Detector

This paper reviews the field of gravitational wave detection. The characteristics of gravitational waves and the possible sources of detectable waves are discussed. This includes a discussion of a new source, the stochastic background of cosmological gravitational waves from supernovae during the epoch of galaxy formation. Methods of using both resonant mass antennas and laser interferometer detectors are reviewed. Noise sources that limit detector sensitivity are summarised, while new methods, and new materials which can simplify and improve detector performance are described.

A New Position Sensitive Detector for X-Ray Diffractometry

1992 ◽  
Vol 36 ◽  
pp. 617-622
Author(s):  
J. L. Radtke ◽  
D. W. Beard
Keyword(s):  
Position Sensitive Detector ◽  
Data Sets ◽  
X Rays ◽  
Sensitive Detector ◽  
Detector Performance ◽  
X Ray ◽  
Time Quantum ◽  
Position Sensitive ◽  
Diffraction Patterns ◽  
The Impact

AbstractPosition sensitive detectors provide efficient X-ray detection over large solid angles; this capability has revolutionized X-ray diffractometry by reducing data collection time. This paper describes testing of a new single-axis position sensitive detector designed to locate 0.6-2 Angstrom X-rays. Dead time, quantum efficiency, energy resolution, and spatial resolution were measured. Standard powder diffraction patterns were observed with the detector, and data sets are presented. The impact of detector performance parameters on diffraction experiments is discussed.

A novel method for assessing position-sensitive detector performance

1989 ◽  
Vol 36 (1) ◽  
pp. 1127-1131
Author(s):  
N.H. Clinthorne ◽  
W.L. Rogers ◽  
L. Shao ◽  
A.O. Hero ◽  
K.F. Koral
Keyword(s):  
Position Sensitive Detector ◽  
Sensitive Detector ◽  
Detector Performance ◽  
Novel Method ◽  
Position Sensitive

Examination of 1-D Position Sensitive Detector Performance Through Analysis of Front Contact Heterojunction

1996 ◽  
Vol 420 ◽  
Author(s):  
M. Topiˇ ◽  
F. Smole ◽  
J. Furlan ◽  
E. Fortunato ◽  
R. Martins
Keyword(s):  
Spectral Response ◽  
Strong Increase ◽  
Cross Contamination ◽  
Sensitive Detector ◽  
Defect States ◽  
Detector Performance ◽  
Photoelectrical Properties ◽  
Position Sensitive ◽  
Position Sensitive Detectors

AbstractThe influence of different TCOs (SnO2 and ITO) on the photoelectrical properties of 1 -D position sensitive detectors based on p-i-n structures was studied. A strong cross-contamination in the p-layer and contamination in the i-layer reduce the quality of the device. Numerical analysis of TCO/p-i-n structure also revealed a strong increase in defect states at the p-layer surface which can be attributed to the reduction of TCO. ITO seems to be less appropriate for a front TCO, although the spectral response of the p-i-n structure under reverse bias is not significantly affected by the conditions at the TCO/p heterojunction.

High-purity Ge x-ray detectors: Sensitivity factors and usefulness

1990 ◽  
Vol 48 (2) ◽  
pp. 548-548
Author(s):  
E. B. Steel
Keyword(s):  
High Purity ◽  
High Energy ◽  
Quantitative Chemical Analysis ◽  
Detector Performance ◽  
X Ray ◽  
Detector Sensitivity ◽  
Specimen Holder ◽  
Many Instruments ◽  
Charge Resolution ◽  
Sensitivity Factors

High Purity Germanium (HPGe) x-ray detectors are now commercially available for the analytical electron microscope (AEM). The detectors have superior efficiency at high x-ray energies and superior resolution compared to traditional lithium-drifted silicon [Si(Li)] detectors. However, just as for the Si(Li), the use of the HPGe detectors requires the determination of sensitivity factors for the quantitative chemical analysis of specimens in the AEM. Detector performance, including incomplete charge, resolution, and durability has been compared to a first generation detector. Sensitivity factors for many elements with atomic numbers 10 through 92 have been determined at 100, 200, and 300 keV. This data is compared to Si(Li) detector sensitivity factors.The overall sensitivity and utility of high energy K-lines are reviewed and discussed. Many instruments have one or more high energy K-line backgrounds that will affect specific analytes. One detector-instrument-specimen holder combination had a consistent Pb K-line background while another had a W K-line background.

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