Examination of 1-D Position Sensitive Detector Performance Through Analysis of Front Contact Heterojunction

1996 ◽  
Vol 420 ◽  
Author(s):  
M. Topiˇ ◽  
F. Smole ◽  
J. Furlan ◽  
E. Fortunato ◽  
R. Martins
Keyword(s):  
Spectral Response ◽  
Strong Increase ◽  
Cross Contamination ◽  
Sensitive Detector ◽  
Defect States ◽  
Detector Performance ◽  
Photoelectrical Properties ◽  
Position Sensitive ◽  
Position Sensitive Detectors

AbstractThe influence of different TCOs (SnO2 and ITO) on the photoelectrical properties of 1 -D position sensitive detectors based on p-i-n structures was studied. A strong cross-contamination in the p-layer and contamination in the i-layer reduce the quality of the device. Numerical analysis of TCO/p-i-n structure also revealed a strong increase in defect states at the p-layer surface which can be attributed to the reduction of TCO. ITO seems to be less appropriate for a front TCO, although the spectral response of the p-i-n structure under reverse bias is not significantly affected by the conditions at the TCO/p heterojunction.

Large Area Flexible Amorphous Silicon Position Sensitive Detectors

2000 ◽  
Vol 609 ◽  
Author(s):  
Elvira M.C. Fortunato ◽  
Donatello Brida ◽  
Isabel M.M. Ferreira ◽  
H. M.B. Åguas ◽  
Patrícia Nunes ◽  
...  
Keyword(s):  
Amorphous Silicon ◽  
Spectral Response ◽  
Chemical Vapour ◽  
Open Circuit ◽  
Large Area ◽  
Force Microscopy ◽  
Glass Substrates ◽  
Chemical Vapour Deposition Technique ◽  
Position Sensitive ◽  
Position Sensitive Detectors

ABSTRACTLarge area thin film position sensitive detectors based on amorphous silicon technology have been prepared on polyimide substrates using the conventional plasma enhanced chemical vapour deposition technique. The sensors have been characterised by spectral response, illuminated I-V characteristics and position detectability measurements. The obtained one dimensional position sensors with 5 mm wide and 60 mm long present a maximum spectral response at 600 nm, an open circuit voltage of 0.6 V and a position detectability with a correlation of 0.9989 associated to a standard deviation of 1×10−2, comparable to those ones produced on glass substrates. The surface of the sensors at each stage of fabrication was investigated by Atomic Force Microscopy.

Flat-cone diffractometer utilizing a linear position-sensitive detector

1978 ◽  
Vol 11 (3) ◽  
pp. 173-178 ◽  
Author(s):  
E. Prince ◽  
A. Wlodawer ◽  
A. Santoro
Keyword(s):  
Data Collection ◽  
Position Sensitive Detector ◽  
X Rays ◽  
Sensitive Detector ◽  
Diffraction Geometry ◽  
Data Rates ◽  
Common Plane ◽  
Mathematical Formulas ◽  
Position Sensitive ◽  
Position Sensitive Detectors

The recent development of linear position-sensitive detectors for neutrons and X-rays leads to the possibility of large improvements in the efficiency of data collection in single-crystal diffractometers. In order to take advantage of the properties of a linear position-sensitive detector it is desirable to use a diffraction geometry which causes the diffracted beams from many different reflecting planes to lie in a common plane. A design for a diffractometer utilizing the flat-cone geometry is described, and the relevant mathematical formulas are summarized. An instrument using this design has been constructed as a modification to an existing four-circle diffractometer and is now operating. Practical details of its construction, of the collection and handling of data, and of data rates are discussed.

A New Position Sensitive Detector for X-Ray Diffractometry

1992 ◽  
Vol 36 ◽  
pp. 617-622
Author(s):  
J. L. Radtke ◽  
D. W. Beard
Keyword(s):  
Position Sensitive Detector ◽  
Data Sets ◽  
X Rays ◽  
Sensitive Detector ◽  
Detector Performance ◽  
X Ray ◽  
Time Quantum ◽  
Position Sensitive ◽  
Diffraction Patterns ◽  
The Impact

AbstractPosition sensitive detectors provide efficient X-ray detection over large solid angles; this capability has revolutionized X-ray diffractometry by reducing data collection time. This paper describes testing of a new single-axis position sensitive detector designed to locate 0.6-2 Angstrom X-rays. Dead time, quantum efficiency, energy resolution, and spatial resolution were measured. Standard powder diffraction patterns were observed with the detector, and data sets are presented. The impact of detector performance parameters on diffraction experiments is discussed.

A novel method for assessing position-sensitive detector performance

1989 ◽  
Vol 36 (1) ◽  
pp. 1127-1131
Author(s):  
N.H. Clinthorne ◽  
W.L. Rogers ◽  
L. Shao ◽  
A.O. Hero ◽  
K.F. Koral
Keyword(s):  
Position Sensitive Detector ◽  
Sensitive Detector ◽  
Detector Performance ◽  
Novel Method ◽  
Position Sensitive

A New Method Based on Position Sensitive Detectors to Measure Four-Degree-of-Freedom Geometric Errors of Linear Guide Rails

2013 ◽  
Vol 706-708 ◽  
pp. 1120-1123 ◽  
Author(s):  
Qing Song ◽  
Hong Ping Wang
Keyword(s):  
Bp Neural Network ◽  
Degree Of Freedom ◽  
Geometric Errors ◽  
Sensitive Detector ◽  
Linear Guide ◽  
Neural Network Algorithm ◽  
Novel Method ◽  
Position Sensitive ◽  
Position Sensitive Detectors ◽  
The Relationship

A novel method adopting position sensitive detector (PSD) and laser collimation technique to measure four-degree-of-freedom of linear guide rails is presented in this paper. The yaw and pitch errors can be obtained based on the relationship between output coordinates of horizontal PSD and angle of the mirror. Meanwhile, the horizontal and vertical straightness errors can be calculated by the relationship between output coordinates of vertical PSD and position of sampling points. Besides, BP neural network algorithm is used to correct the nonlinearity between actual and ideal output of PSD. The method is analysed theoretically in detail. The experimental results show that the four-degree-of-freedom of linear guide rails can be measured with high accuracy.

Role of the Collecting Resistive Layer on the Static Characteristics of 2D a-Si:H thin Film Position Sensitive Detector

1998 ◽  
Vol 507 ◽  
Author(s):  
E. Fortunato ◽  
R. Martins
Keyword(s):  
Thin Film ◽  
Amorphous Silicon ◽  
Analytical Model ◽  
Sensitive Detector ◽  
Static Characteristics ◽  
Resistive Layer ◽  
Position Sensitive ◽  
Predicted Values ◽  
Position Sensitive Detectors

ABSTRACTThe aim of this work is to present an analytical model able to interpret the role of the thin collecting resistive layer on the static performances exhibited by 2D amorphous silicon hydrogenated pin thin film position sensitive detectors. In addition, experimental results concerning the device linearity and spatial resolution are presented and checked against the predicted values of the analytical model proposed.

scholarly journals Texture Analysis by Neutron Diffraction Using a Linear Position Sensitive Detector

1989 ◽  
Vol 10 (4) ◽  
pp. 375-387 ◽  
Author(s):  
G. Will ◽  
W. Schäfer ◽  
P. Merz
Keyword(s):  
Neutron Diffraction ◽  
Texture Analysis ◽  
Profile Analysis ◽  
Position Sensitive Detector ◽  
Sensitive Detector ◽  
X Ray ◽  
Position Sensitive ◽  
Hematite Ore ◽  
Position Sensitive Detectors ◽  
Low Symmetry

Neutron diffraction in connection with a position-sensitive detector is a most powerful technique in texture analysis comparable in time with conventional X-ray laboratory technique. Neutrons measure the global texture of the sample allowing volumes up to several cm3. By using position-sensitive detectors and applying the mathematical procedures of profile analysis multiphase and low symmetry materials can be investigated without serious difficulties. Neutron diffraction experiments operating in transmission record complete diffraction profiles; overlapping lines are unscrambled by profile analysis. Technical and physical specifications of the dedicated detector JULIOS, installed on the texture diffractometer of Bonn University, are given. A hematite ore has been studied by this technique and the results are given.

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