2 MeV proton radiation damage studies of gallium nitride films through low temperature photoluminescence spectroscopy measurements

2000 ◽  
Vol 47 (6) ◽  
pp. 2322-2328 ◽  
Author(s):  
S.M. Khanna ◽  
J. Webb ◽  
H. Tang ◽  
A.J. Houdayer ◽  
C. Carlone
2011 ◽  
Vol 679-680 ◽  
pp. 173-176
Author(s):  
John W. Steeds

In the course of studying by low temperature photoluminescence spectroscopy a wide range of electron-irradiated samples of p(Al)-type epitaxial layers of 4H SiC, from a variety of different sources of supply, the results were found to fit into two very different categories. The origin of these differences has been explored using a wide range of experimental techniques and found to result from the degree of compensation of the aluminium by nitrogen in the layers. Nitrogen concentrations deduced by SIMS experiments on these materials were found to be unreliable. The two different categories of material, called V and AB here, showed marked differences in their subsequent annealing behaviour and the implications of this distinction are discussed.


2008 ◽  
Vol 600-603 ◽  
pp. 437-440 ◽  
Author(s):  
John W. Steeds

A common set of optical centres found in photoluminescence spectra of electron irradiated 4H SiC is interpreted as originating in neutral carbon-vacancy carbon anti-site pairs.


2015 ◽  
Vol 119 (21) ◽  
pp. 11846-11851 ◽  
Author(s):  
Giulia Tregnago ◽  
Michael Wykes ◽  
Giuseppe M. Paternò ◽  
David Beljonne ◽  
Franco Cacialli

2004 ◽  
Vol 51 (6) ◽  
pp. 3585-3594 ◽  
Author(s):  
S.M. Khanna ◽  
D. Estan ◽  
A. Houdayer ◽  
H.C. Liu ◽  
R. Dudek

Molecules ◽  
2016 ◽  
Vol 21 (7) ◽  
pp. 885 ◽  
Author(s):  
Khaoula Jemli ◽  
Hiba Diab ◽  
Ferdinand Lédée ◽  
Gaelle Trippé-Allard ◽  
Damien Garrot ◽  
...  

2010 ◽  
Vol 645-648 ◽  
pp. 171-174 ◽  
Author(s):  
Jean Lorenzzi ◽  
Georgios Zoulis ◽  
Olivier Kim-Hak ◽  
Nikoletta Jegenyes ◽  
Davy Carole ◽  
...  

We report the results of a systematic investigation performed to reduce the residual n-type doping level of the 3C-SiC layers grown by the VLS mechanism on 6H-SiC(0001) on-axis substrate. This new approach, termed “High purity VLS” leads to low doped and low compensated material, which was confirmed by Raman and Low Temperature Photoluminescence spectroscopy. The resultant 3C morphology remains typical of single-domain layers and the n-type doping level could be estimated around 6x1016 cm-3.


1999 ◽  
Vol 60 (19) ◽  
pp. 13335-13338 ◽  
Author(s):  
V. Emiliani ◽  
Ch. Lienau ◽  
M. Hauert ◽  
G. Colí ◽  
M. DeGiorgi ◽  
...  

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