Use of new ENDF/B-VI proton and neutron cross sections for single event upset calculations

1999 ◽  
Vol 46 (6) ◽  
pp. 1386-1394 ◽  
Author(s):  
M.B. Chadwick ◽  
E. Normand
Keyword(s):  
Cross Sections ◽  
Single Event Upset ◽  
Single Event ◽  
Neutron Cross Sections

Relations Between Basic Nuclear Data and Single-Event Upsets Phenomena

MRS Bulletin ◽  
2003 ◽  
Vol 28 (2) ◽  
pp. 121-125 ◽  
Author(s):  
Jan Blomgren ◽  
Bo Granbom ◽  
Thomas Granlund ◽  
Nils Olsson
Keyword(s):  
Cross Sections ◽  
Nuclear Physics ◽  
Nuclear Data ◽  
Single Event Upset ◽  
Single Event ◽  
Neutron Data ◽  
Neutron Energy Range ◽  
Single Event Upsets ◽  
Technology Generation ◽  
Spallation Reactions

AbstractThis article approaches single-event upset (SEU) problems from the standpoint of experimental nuclear physics, with a focus on certain neutron experiments and neutron data essential for SEU studies. A review is given of some research programs, both basic and applied, that are strongly motivated by SEU applications. Some specific examples are presented from the The (short for Theodor) Svedberg Laboratory (TSL) in Uppsala, Sweden: First, using the quasi-monoenergetic neutron beam, SEU cross sections (of chips) are measured over the neutron energy range of 20–150 MeV. Data from the same technology generation, in general, can be fitted into a simple curve. Second, the particle origins of SEUs are discussed from the framework of neutron–nucleus spallation reactions.

Parametric Variability Affecting 45 nm SOI SRAM Single Event Upset Cross-Sections

2010 ◽  
Author(s):  
Thomas Daniel Loveless ◽  
Michael L. Alles ◽  
Dennis R. Ball ◽  
Kevin M. Warren ◽  
Lloyd W. Massengill
Keyword(s):  
Cross Sections ◽  
Single Event Upset ◽  
Single Event

Single Event Upset cross sections at various data rates

1996 ◽  
Vol 43 (6) ◽  
pp. 2862-2867 ◽  
Author(s):  
R.A. Reed ◽  
M.A. Carts ◽  
P.W. Marshall ◽  
C.J. Marshall ◽  
S. Buchner ◽  
...  
Keyword(s):  
Cross Sections ◽  
Single Event Upset ◽  
Single Event ◽  
Data Rates

Technology Scaling Comparison of Flip-Flop Heavy-Ion Single-Event Upset Cross Sections

2013 ◽  
Vol 60 (6) ◽  
pp. 4368-4373 ◽  
Author(s):  
N. J. Gaspard ◽  
S. Jagannathan ◽  
Z. J. Diggins ◽  
M. P. King ◽  
S-J. Wen ◽  
...  
Keyword(s):  
Cross Sections ◽  
Heavy Ion ◽  
Single Event Upset ◽  
Single Event ◽  
Flip Flop ◽  
Technology Scaling
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