20-element HgI/sub 2/ energy dispersive X-ray array detector system

1992 ◽  
Vol 39 (5) ◽  
pp. 1275-1280 ◽  
Author(s):  
J.S. Iwanczyk ◽  
N. Dorri ◽  
M. Wang ◽  
R.W. Szczebiot ◽  
A.J. Dabrowski ◽  
...  
Keyword(s):  
Detector System ◽  
Energy Dispersive ◽  
Array Detector ◽  
X Ray

Silicon array detector system for high-rate, low-noise X-ray spectroscopy

1999 ◽  
Vol 46 (4) ◽  
pp. 886-889 ◽  
Author(s):  
B.A. Ludewigt ◽  
B. Krieger ◽  
D. Lindstrom ◽  
M.R. Maier ◽  
M. Rutgersson ◽  
...  
Keyword(s):  
Low Noise ◽  
Detector System ◽  
High Rate ◽  
Array Detector ◽  
X Ray

The On-Stream X-Ray Analysis of Slurries for Process Control

1991 ◽  
Vol 35 (A) ◽  
pp. 661-672
Author(s):  
Johann P. Engelbrecht ◽  
Johan P.R. de Villiers ◽  
Stefan W. de Bruyn
Keyword(s):  
Process Control ◽  
Base Metal ◽  
Pyrolytic Graphite ◽  
Xrd Analysis ◽  
Detector System ◽  
Energy Dispersive ◽  
Heavy Minerals ◽  
Handling System ◽  
X Ray

AbstractAn integrated XRD-XRF system for the on-stream analysis of slurries was configured to the requirements of industry for process control. The slurry-handling system includes a multiplexer, header tank, de-aerator and a windowless sample presenter. The XRD part of the system is composed of a molybdenum anode X-ray tube, a pyrolytic graphite primarybeam monochromator, a vertical fixed-geometry goniometer, and a simultaneous detector system. The X-ray beam is transmitted through the slurry curtain so that the diffracted intensities are measured in the forward diffracted mode. The energy-dispersive XRF spectrometer measures the reflected fluorescence intensities. Examples and data from the onstream XRD analysis of fluorspar and apatite are presented. Mention is made of the application of an integrated XRD-XRF system in the heavy-minerals and base-metal industries.

An energy-dispersive spectrometer for the rapid measurement of X-ray absorption spectra using synchrotron radiation

1983 ◽  
Vol 16 (2) ◽  
pp. 220-232 ◽  
Author(s):  
R. P. Phizackerley ◽  
Z. U. Rek ◽  
G. B. Stephenson ◽  
S. D. Conradson ◽  
K. O. Hodgson ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Absorption Spectra ◽  
Materials Science ◽  
Energy Dispersive Spectrometer ◽  
Energy Dispersive ◽  
Small Samples ◽  
Array Detector ◽  
Beam Position ◽  
X Ray ◽  
X Ray Absorption

The design and evaluation of an energy-dispersive spectrometer to measure X-ray absorption spectra rapidly using a synchrotron-radiation source is presented. The method employs a cylindrically bent triangular crystal to focus and disperse a quasi-parallel polychromatic X-ray beam onto the sample. The beam passing through the sample then diverges towards an X-ray detector where beam position can be correlated to energy. Both concentrated and dilute samples were measured on X-ray film and with an electronic linear photodiode array detector and the data analysed to determine the resolution obtained and the data quality. This method is shown to provide an efficient way to obtain high-quality EXAFS and absorption-edge data and should permit kinetic studies to be performed on small samples with good counting statistics. The method should find application in the fields of biophysics, chemistry and materials science.

scholarly journals Superconducting Detector System for High-Resolution Energy-Dispersive Soft X-Ray Spectroscopy

2001 ◽  
Author(s):  
S Friedrich ◽  
T Niedermayr ◽  
O Drury ◽  
T Funk ◽  
M Frank ◽  
...  
Keyword(s):  
High Resolution ◽  
Detector System ◽  
Energy Dispersive ◽  
Superconducting Detector ◽  
X Ray

Microanalysis of precipitates in a ferritic steel

1978 ◽  
Vol 36 (1) ◽  
pp. 618-619
Author(s):  
J.M. Titchmarsh
Keyword(s):  
Ferritic Steel ◽  
Particle Identification ◽  
Energy Dispersive ◽  
Objective Lens ◽  
Ferritic Steels ◽  
Replica Technique ◽  
X Ray ◽  
Large Numbers ◽  
Scanning Transmission ◽  
Made In

The advances in recent years in the microanalytical capabilities of conventional TEM's fitted with probe forming lenses allow much more detailed investigations to be made of the microstructures of complex alloys, such as ferritic steels, than have been possible previously. In particular, the identification of individual precipitate particles with dimensions of a few tens of nanometers in alloys containing high densities of several chemically and crystallographically different precipitate types is feasible. The aim of the investigation described in this paper was to establish a method which allowed individual particle identification to be made in a few seconds so that large numbers of particles could be examined in a few hours.A Philips EM400 microscope, fitted with the scanning transmission (STEM) objective lens pole-pieces and an EDAX energy dispersive X-ray analyser, was used at 120 kV with a thermal W hairpin filament. The precipitates examined were extracted using a standard C replica technique from specimens of a 2¼Cr-lMo ferritic steel in a quenched and tempered condition.

Energy Dispersive X-Ray Measurements of thin Metal Foils

1976 ◽  
Vol 34 ◽  
pp. 426-427
Author(s):  
J. Bentley ◽  
E. A. Kenik
Keyword(s):  
Materials Science ◽  
Energy Dispersive Spectrometer ◽  
Thin Foil ◽  
Thin Metal ◽  
Energy Dispersive ◽  
Thin Specimen ◽  
X Ray ◽  
Metal Foils ◽  
Small Probe ◽  
Scanning Transmission

Instruments combining a 100 kV transmission electron microscope (TEM) with scanning transmission (STEM), secondary electron (SEM) and x-ray energy dispersive spectrometer (EDS) attachments to give analytical capabilities are becoming increasingly available and useful. Some typical applications in the field of materials science which make use of the small probe size and thin specimen geometry are the chemical analysis of small precipitates contained within a thin foil and the measurement of chemical concentration profiles near microstructural features such as grain boundaries, point defect clusters, dislocations, or precipitates. Quantitative x-ray analysis of bulk samples using EDS on a conventional SEM is reasonably well established, but much less work has been performed on thin metal foils using the higher accelerating voltages available in TEM based instruments.

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