Imaging charge-coupled device (CCD) transient response to 17 and 50 MeV proton and heavy-ion irradiation

1990 ◽  
Vol 37 (6) ◽  
pp. 1876-1885 ◽  
Author(s):  
T.S. Lomheim ◽  
R.M. Shima ◽  
J.R. Angione ◽  
W.F. Woodward ◽  
D.J. Asman ◽  
...  
Keyword(s):  
Transient Response ◽  
Ion Irradiation ◽  
Heavy Ion ◽  
Charge Coupled Device ◽  
Heavy Ion Irradiation

Transient Response of 0.18- ${\mu}$ m SOI MOSFETs and SRAM Bit-Cells to Heavy-Ion Irradiation for Variable SOI Film Thickness

2018 ◽  
Vol 65 (11) ◽  
pp. 4826-4833 ◽  
Author(s):  
Kritika Aditya ◽  
Chandan K. Jha ◽  
Sanjeev Basra ◽  
H. S. Jatana ◽  
Abhisek Dixit
Keyword(s):  
Film Thickness ◽  
Transient Response ◽  
Ion Irradiation ◽  
Heavy Ion ◽  
Heavy Ion Irradiation

Transient response of III-V field-effect transistors to heavy-ion irradiation

2004 ◽  
Vol 51 (6) ◽  
pp. 3324-3331 ◽  
Author(s):  
D. McMorrow ◽  
J.B. Boos ◽  
A.R. Knudson ◽  
W.T. Lotshaw ◽  
Doe Park ◽  
...  
Keyword(s):  
Transient Response ◽  
Field Effect ◽  
Field Effect Transistors ◽  
Ion Irradiation ◽  
Heavy Ion ◽  
Heavy Ion Irradiation

Superior Transient Response to Heavy-Ion Irradiation by N-Channel SOI-iFinFETs

2019 ◽  
pp. 1-7
Author(s):  
Kritika Aditya ◽  
Ramendra Singh ◽  
Anil Kumar Bansal ◽  
Rohit Saini ◽  
Anshul Gupta ◽  
...  
Keyword(s):  
Transient Response ◽  
Ion Irradiation ◽  
Heavy Ion ◽  
Heavy Ion Irradiation

Sound velocity of glassy Pd 80 Si 20 after heavy-ion irradiation at low temperatures

2002 ◽  
Vol 82 (11) ◽  
pp. 2333-2339
Author(s):  
G. Schumacher ◽  
R. C. Birtcher ◽  
D. P. Renusch ◽  
M. Grimsditch ◽  
L. E. Rehn
Keyword(s):  
Sound Velocity ◽  
Low Temperatures ◽  
Ion Irradiation ◽  
Heavy Ion ◽  
Heavy Ion Irradiation

Exploration of heavy ion irradiation effects on gate oxide reliability in power MOSFETs

1995 ◽  
Vol 35 (3) ◽  
pp. 603-608 ◽  
Author(s):  
S.R. Anderson ◽  
R.D. Schrimpf ◽  
K.F. Galloway ◽  
J.L. Titus
Keyword(s):  
Ion Irradiation ◽  
Gate Oxide ◽  
Heavy Ion ◽  
Irradiation Effects ◽  
Power Mosfets ◽  
Heavy Ion Irradiation ◽  
Oxide Reliability
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