Total-dose radiation-induced degradation of thin film ferroelectric capacitors

1990 ◽  
Vol 37 (6) ◽  
pp. 1703-1712 ◽  
Author(s):  
J.R. Schwank ◽  
R.D. Nasby ◽  
S.L. Miller ◽  
M.S. Rodgers ◽  
P.V. Dressendorfer
Keyword(s):  
Thin Film ◽  
Total Dose ◽  
Radiation Induced ◽  
Ferroelectric Capacitors ◽  
Dose Radiation

scholarly journals Total dose radiation induced changes of the floating body effects in the partially depleted SOI NMOS with ultrathin gate oxide

2018 ◽  
Vol 15 (4) ◽  
pp. 20171236-20171236
Author(s):  
Zhiyuan Hu ◽  
Lihua Dai ◽  
Zhengxuan Zhang ◽  
Xiaoyun Li ◽  
Shichang Zou
Keyword(s):  
Total Dose ◽  
Gate Oxide ◽  
Floating Body ◽  
Radiation Induced ◽  
Induced Changes ◽  
Dose Radiation ◽  
Floating Body Effects

Total dose radiation effects of Pt/PZT/Pt ferroelectric capacitors fabricated by PLD method

1999 ◽  
Vol 14 (9) ◽  
pp. 836-839 ◽  
Author(s):  
Jianxia Gao ◽  
Lirong Zheng ◽  
Biping Huang ◽  
Zhitang Song ◽  
Lixin Yang ◽  
...  
Keyword(s):  
Total Dose ◽  
Radiation Effects ◽  
Ferroelectric Capacitors ◽  
Dose Radiation

Failure Analysis of Total-Dose Radiation-Induced Degradation on FinFET Logic ICs

2020 ◽  
Author(s):  
Joy Y. Liao ◽  
Somayyeh Rahimi ◽  
Christian Schmidt ◽  
Howard Lee Marks
Keyword(s):  
Failure Analysis ◽  
Total Dose ◽  
Semiconductor Industry ◽  
Total Ionizing Dose ◽  
X Ray ◽  
Surface Mount ◽  
X Ray Imaging ◽  
Device Applications ◽  
Radiation Induced ◽  
Dose Radiation

Abstract X-ray imaging for both Failure Analysis and In-line Inspection has been utilized widely in the semiconductor industry, especially for surface mount device applications. During the investigation of total ionizing dose (TID) induced degradation of logic ICs with bulk FinFET technology, we observed that the degradation is mainly in the form of an increase in I/O leakage and IDDQ. Using filters during radiation was shown to impact TID. Failure Analysis was performed to localize the excessive current in both I/O leakage and IDDQ.

Transient and Total Dose Radiation Properties of the CMOS/SOS EPIC Chip Set

1983 ◽  
Vol 30 (6) ◽  
pp. 4256-4263 ◽  
Author(s):  
R. Berger ◽  
A. Shevchenko ◽  
G. J. Brucker ◽  
R. Kennerud ◽  
P. Measel ◽  
...  
Keyword(s):  
Total Dose ◽  
Radiation Properties ◽  
Dose Radiation

Influence of total-dose radiation on the electrical characteristics of SOI MOSFETs

2004 ◽  
Vol 72 (1-4) ◽  
pp. 332-341 ◽  
Author(s):  
J.A. Felix ◽  
J.R. Schwank ◽  
C.R. Cirba ◽  
R.D. Schrimpf ◽  
M.R. Shaneyfelt ◽  
...  
Keyword(s):  
Total Dose ◽  
Electrical Characteristics ◽  
Dose Radiation

X-ray radiation source for total dose radiation studies

2004 ◽  
Vol 71 (3-4) ◽  
pp. 713-715 ◽  
Author(s):  
D. Bisello ◽  
A. Candelori ◽  
A. Kaminski ◽  
A. Litovchenko ◽  
E. Noah ◽  
...  
Keyword(s):  
Total Dose ◽  
Radiation Source ◽  
X Ray ◽  
Dose Radiation

Low-dose radiation-induced acute pericarditis (AP) in breast cancer patient

2013 ◽  
Vol 18 ◽  
pp. S179-S180 ◽  
Author(s):  
I. Alastuey ◽  
A. Noé ◽  
C. Chiaramello ◽  
S. Montemuiño ◽  
J. Pardo
Keyword(s):  
Breast Cancer ◽  
Cancer Patient ◽  
Breast Cancer Patient ◽  
Low Dose ◽  
Low Dose Radiation ◽  
Acute Pericarditis ◽  
Radiation Induced ◽  
Dose Radiation
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