RF circuit performance degradation due to soft breakdown and hot-carrier effect in deep-submicrometer CMOS technology

2001 ◽  
Vol 49 (9) ◽  
pp. 1546-1551 ◽  
Author(s):  
Qiang Li ◽  
Jinlong Zhang ◽  
Wei Li ◽  
J.S. Yuan ◽  
Yuan Chen ◽  
...  
Keyword(s):  
Cmos Technology ◽  
Performance Degradation ◽  
Circuit Performance ◽  
Hot Carrier ◽  
Carrier Effect ◽  
Deep Submicrometer ◽  
Hot Carrier Effect ◽  
Soft Breakdown ◽  
Rf Circuit

The case of AC stress in the hot-carrier effect

1986 ◽  
Vol 33 (3) ◽  
pp. 424-426 ◽  
Author(s):  
Kueing-Long Chen ◽  
S. Saller ◽  
R. Shah
Keyword(s):  
Hot Carrier ◽  
Carrier Effect ◽  
Hot Carrier Effect

Hot-Carrier Effect on TID Irradiated Short-Channel UTTB FD-SOI n-MOSFETs

2018 ◽  
Author(s):  
Jiangwei Cui ◽  
Qiwen Zheng ◽  
Bingxu Ning ◽  
Xuefeng Yu ◽  
Kai Zhao ◽  
...  
Keyword(s):  
Short Channel ◽  
Hot Carrier ◽  
Carrier Effect ◽  
Hot Carrier Effect
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