FD-TLM electromagnetic field simulation of high-speed Josephson junction digital logic gates

1996 ◽  
Vol 44 (7) ◽  
pp. 1103-1108 ◽  
Author(s):  
C.G. Sentelle ◽  
R.H. Voelker
Keyword(s):  
Electromagnetic Field ◽  
Josephson Junction ◽  
High Speed ◽  
Logic Gates ◽  
Digital Logic ◽  
Field Simulation

Improvement of Single-Electron Digital Logic Gates by Utilizing Input Discretizers

2016 ◽  
Vol E99.C (2) ◽  
pp. 285-292 ◽  
Author(s):  
Tran THI THU HUONG ◽  
Hiroshi SHIMADA ◽  
Yoshinao MIZUGAKI
Keyword(s):  
Logic Gates ◽  
Single Electron ◽  
Digital Logic

scholarly journals Digital logic gates in soft, conductive mechanical metamaterials

2021 ◽  
Vol 12 (1) ◽  
Author(s):  
Charles El Helou ◽  
Philip R. Buskohl ◽  
Christopher E. Tabor ◽  
Ryan L. Harne
Keyword(s):  
Integrated Circuits ◽  
Electronic Materials ◽  
Polymer Networks ◽  
Conductive Polymer ◽  
Network Connectivity ◽  
Logic Gates ◽  
Boolean Logic ◽  
Digital Logic ◽  
Mechanical Metamaterials ◽  
Logic Operations

AbstractIntegrated circuits utilize networked logic gates to compute Boolean logic operations that are the foundation of modern computation and electronics. With the emergence of flexible electronic materials and devices, an opportunity exists to formulate digital logic from compliant, conductive materials. Here, we introduce a general method of leveraging cellular, mechanical metamaterials composed of conductive polymers to realize all digital logic gates and gate assemblies. We establish a method for applying conductive polymer networks to metamaterial constituents and correlate mechanical buckling modes with network connectivity. With this foundation, each of the conventional logic gates is realized in an equivalent mechanical metamaterial, leading to soft, conductive matter that thinks about applied mechanical stress. These findings may advance the growing fields of soft robotics and smart mechanical matter, and may be leveraged across length scales and physics.

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