Time decay of the remanent magnetization in longitudinal thin film recording media as a function of distributions of grain size and easy-axis orientation

1998 ◽  
Vol 34 (4) ◽  
pp. 1606-1608 ◽  
Author(s):  
Cheng Yang ◽  
J.M. Sivertsen ◽  
J.H. Judy
Keyword(s):  
Thin Film ◽  
Grain Size ◽  
Remanent Magnetization ◽  
Easy Axis ◽  
Recording Media ◽  
Time Decay ◽  
Axis Orientation

Crystal Structure and Magnetic Properties of Co-Based Alloy Thin Film Prepared on Cr Underlayer With Good Crystallite Orientation

1991 ◽  
Vol 232 ◽  
Author(s):  
T. Kawanabe ◽  
J. G. Park ◽  
M. Naoe
Keyword(s):  
Thin Film ◽  
Crystal Orientation ◽  
Flat Surface ◽  
Film Plane ◽  
Recording Media ◽  
Alloy Thin Film ◽  
Crystallite Orientation ◽  
Axis Orientation ◽  
Glass Substrates ◽  
High Density Recording

ABSTRACTCo85Cr15-xTax(x:0, 2at%)/Cr films with microscopically flat surface were investigated for high density recording media. These films were deposited on silicon wafer and glass substrates at the substrate temperature Ts of 350 °C at argon pressure as low as sub-mTorr by using Facing Targets Sputtering (FTS) apparatus. The elevating of Ts promoted the Cr(200) orientation in film plane, leading to the in-plane c-axis orientation of Co crystallites. Addition of some elements such as Si, Ge and Ta in Cr thin film was found to stabilize Cr(110) crystal orientation even at Ts of 300 °C.

New technique to determine the magnetic easy axis orientation in recording media

2005 ◽  
Vol 97 (10) ◽  
pp. 10N115 ◽  
Author(s):  
A. Berger ◽  
E. Marinero ◽  
M. Doerner ◽  
X. Bian ◽  
K. Tang ◽  
...  
Keyword(s):  
Easy Axis ◽  
New Technique ◽  
Recording Media ◽  
Axis Orientation ◽  
Magnetic Easy Axis

Improvement of crystallographic characteristics of CoCrTa thin film using double underlayer

2001 ◽  
Vol 674 ◽  
Author(s):  
Y.J. Kim ◽  
S.H. Kong ◽  
S. Nakagawa ◽  
M. Naoe ◽  
K.H. Kim
Keyword(s):  
Thin Film ◽  
Magnetic Recording ◽  
Magnetic Layer ◽  
Recording Media ◽  
Interlayer Thickness ◽  
Magnetic Recording Media ◽  
Axis Orientation ◽  
Perpendicular Magnetic Recording ◽  
High Density Recording ◽  
Crystallographic Characteristics

ABSTRACTHigh c-axis oriented CoCr-based thin films are expected for ultra-high density recording media in perpendicular magnetic recording system. In order to improve dispersion angle of c-axis of CoCr-based for perpendicular magnetic recording media, we prepared trilayered film with double underlayer using New Facing Targets Sputtering apparatus. The thickness of magnetic layer CoCrTa and double underlayer, such as interlayer Pt, paramagnetic CoCr, underlayer Ti was fixed 50nm and 20nm respectively. In order to prepare the thin film, we fixed argon gas pressure 1mTorr, substrate temperature 250°C and input current 0.5A. The crystallographic characteristics of CoCrTa layer with varying interlayer thickness (0- 20nm) have been investigated. By the result, the CoCrTa trilayered thin film with interlayer Pt showed good c-axis orientation 3.45° and 3.62° at thickness 5nm and 10nm respectively. However, CoCrTa thin film using interlayer paramagnetic CoCr showed 8.28° and 8.62° at thickness 5nm and 10nm respectively.

Barium ferrite thin film media with perpendicular c-axis orientation and small grain size

2000 ◽  
Vol 87 (9) ◽  
pp. 6370-6372 ◽  
Author(s):  
Zailong Zhuang ◽  
Maithri Rao ◽  
Robert M. White ◽  
David E. Laughlin ◽  
Mark H. Kryder
Keyword(s):  
Thin Film ◽  
Grain Size ◽  
Barium Ferrite ◽  
Axis Orientation
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