A simple built-in current sensor for current monitoring in mixed-signal circuits

1997 ◽  
Vol 46 (6) ◽  
pp. 1301-1304 ◽  
Author(s):  
S. Siskos ◽  
A.A. Hatzopoulos
Keyword(s):  
Current Sensor ◽  
Mixed Signal ◽  
Mixed Signal Circuits ◽  
Current Monitoring

scholarly journals Application of Dynamic Supply Current Monitoring to Testing Mixed-Signal Circuits

VLSI Design ◽  
1997 ◽  
Vol 5 (3) ◽  
pp. 223-240
Author(s):  
Mahmoud A. Al-Qutayri ◽  
Peter R. Shepherd
Keyword(s):  
Time Domain ◽  
Power Supply ◽  
Testing Technique ◽  
Mixed Signal ◽  
Single Fault ◽  
Mixed Signal Circuits ◽  
Supply Current ◽  
The Time Domain ◽  
Current Monitoring ◽  
Dynamic Power Supply Current

This paper applies the time-domain testing technique and compares the effectiveness of transient voltage and dynamic power supply current measurements in detecting faults in CMOS mixed-signal circuits. The voltage and supply current (iDDT) measurements are analyzed by three methods to detect the presence of a fault, and to establish which measurement achieves higher confidence in the detection. Catastrophic, soft and stuck-at single fault conditions were introduced to the circuit-under-test (CUT). The time-domain technique tests a mixed-signal CUT in a unified fashion, thereby eliminating the need to partition the CUT into separate analogue and digital modules.

Verification of Analog/Mixed-Signal Circuits Using Symbolic Methods

2008 ◽  
Vol 27 (12) ◽  
pp. 2223-2235 ◽  
Author(s):  
David Walter ◽  
Scott Little ◽  
Chris Myers ◽  
Nicholas Seegmiller ◽  
Tomohiro Yoneda
Keyword(s):  
Mixed Signal ◽  
Mixed Signal Circuits ◽  
Symbolic Methods

Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits

2010 ◽  
Vol 26 (1) ◽  
pp. 73-86 ◽  
Author(s):  
Hongjoong Shin ◽  
Joonsung Park ◽  
Jacob A. Abraham
Keyword(s):  
Mixed Signal ◽  
Mixed Signal Circuits
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