Measurement of the thickness of dielectric thin films on silicon photodetectors using the angular response to incident linearly polarized light

1994 ◽  
Vol 43 (6) ◽  
pp. 799-802 ◽  
Author(s):  
R.M.A. Azzam ◽  
M.M.K. Howlader
Keyword(s):  
Thin Films ◽  
Polarized Light ◽  
Dielectric Thin Films ◽  
Angular Response ◽  
Linearly Polarized

Properties of Epitaxial ZnO Thin Films for GaN and Related Applications

1998 ◽  
Vol 537 ◽  
Author(s):  
H. Shen ◽  
M. Wraback ◽  
J. Pamulapati ◽  
S. Liang ◽  
C. Gorla ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Anisotropy ◽  
Polarized Light ◽  
Chemical Vapor ◽  
Zno Thin Films ◽  
Organic Chemical ◽  
Zno Films ◽  
Light Modulator ◽  
Cross Sectional ◽  
Linearly Polarized

AbstractIn this paper, we present a detailed study of high quality (110) ZnO films, epitaxially grown on R-plane sapphire substrates by metal-organic chemical vapor deposition (MOCVD). The epitaxial relationships are (1120) ZnO//(0112) Al2O3 and {0001} ZnO//[0111] A12O3 as confirmed by X-ray diffraction (θ-2θ, and φ-scan) and high-resolution cross-sectional transmission electron microscopy (HR-TEM). Low temperature photoluminescence (PL) indicates the ZnO thin films are almost strain free. Optical absorption and reflection measurements with linearly polarized light indicate a strong optical anisotropy. The polarization rotation towards the C-axis associated with the optical anisotropy is utilized to demonstrate an optically addressed ultra-fast, ultraviolet light modulator.

Selective transmittance of linearly polarized light in thin films rationally designed by FDTD and FDFD theories and fabricated by glancing angle deposition

2008 ◽  
Vol 104 (10) ◽  
pp. 104302 ◽  
Author(s):  
Viktor Leontyev ◽  
Nicholas G. Wakefield ◽  
Kyrylo Tabunshchyk ◽  
Jeremy C. Sit ◽  
Michael J. Brett ◽  
...  
Keyword(s):  
Thin Films ◽  
Polarized Light ◽  
Glancing Angle Deposition ◽  
Glancing Angle ◽  
Linearly Polarized ◽  
Angle Deposition

TEMPERATURE DEPENDENCE OF PHOTOINDUCED ANISOTROPY IN THE PHOTOCONDUCTIVITY OF As2Se3 AND Sb2S3 THIN FILMS

2008 ◽  
Vol 22 (20) ◽  
pp. 1951-1957
Author(s):  
K. ATAK ◽  
G. AKTAŞ ◽  
Y. SKARLATOS ◽  
M. N. INCI
Keyword(s):  
Thin Films ◽  
Temperature Dependence ◽  
Polarized Light ◽  
Photoinduced Anisotropy ◽  
Linearly Polarized ◽  
Increasing Temperature

The temperature dependence of photoinduced anisotropy in the photoconductivity of As 2 Se 3 and Sb 2 S 3 thin films was investigated, in the interval between -50 and 70°C. Our results demonstrate that for both As 2 Se 3 and Sb 2 S 3 thin films, the anisotropy percentage falls with increasing temperature. We surmise that the aligning effect of the linearly polarized light was diluted with increasing temperature, because the latter induces similar mechanisms to those induced by polarized light, but in an isotropic fashion.

scholarly journals Fixed polarizer ellipsometry for simple and sensitive detection of thin films generated by specific molecular interactions: applications in immunoassays and DNA sequence detection

1998 ◽  
Vol 44 (9) ◽  
pp. 2031-2035 ◽  
Author(s):  
Rachel M Ostroff ◽  
Diana Maul ◽  
Gregory R Bogart ◽  
Shao Yang ◽  
Jennifer Christian ◽  
...  
Keyword(s):  
Thin Films ◽  
Molecular Interactions ◽  
Group A Streptococcus ◽  
Hepatitis B Surface Antigen ◽  
Polarized Light ◽  
Single Layer ◽  
Sequence Detection ◽  
Linearly Polarized ◽  
Biological Thin Films ◽  
Dna Sequence Detection

Abstract Biological thin films may form on a surface by specific molecular interactions. The fixed polarizer ellipsometer (FPE) is a sensitive instrument that detects biological thin films either qualitatively or quantitatively. The design is simple and inexpensive. The assays are formatted on an optical surface, and the FPE detection is based on the phase shift of linearly polarized light after reflection through a thin film. We have constructed mathematical models of the FPE response to reflection through single-layer and two-layer films that agree closely with experimental data. Several biological assays have been measured with the FPE to demonstrate the application of this technology to clinical targets, including ultrasensitive immunoassays for hepatitis B surface antigen (0.1 ng/mL) and α-fetoprotein (0.01 ng/mL) and DNA hybridization (0.5 fmol/μL target probe). A clinical study for detection of group A streptococcus from patient throat swabs demonstrated the qualitative application of the FPE to infectious disease targets. The flexibility and sensitivity of the FPE makes this technology suitable for numerous target analytes and applications.

Finite-Element Modeling and Quantitative Measurement Using Scanning Microwave Microscopy to Characterize Dielectric Films

2018 ◽  
Author(s):  
K. A. Rubin ◽  
W. Jolley ◽  
Y. Yang
Keyword(s):  
Thin Films ◽  
Dielectric Film ◽  
Dielectric Constants ◽  
Dielectric Films ◽  
Silicon Substrates ◽  
Fem Modeling ◽  
Dielectric Thin Films ◽  
Microwave Microscopy ◽  
Scanning Microwave Microscopy ◽  
Low K

Abstract Scanning Microwave Impedance Microscopy (sMIM) can be used to characterize dielectric thin films and to quantitatively discern film thickness differences. FEM modeling of the sMIM response provides understanding of how to connect the measured sMIM signals to the underlying properties of the dielectric film and its substrate. Modeling shows that sMIM can be used to characterize a range of dielectric film thicknesses spanning both low-k and medium-k dielectric constants. A model system consisting of SiO2 thin films of various thickness on silicon substrates is used to illustrate the technique experimentally.

Tunable microwave mixing in nonlinear dielectric thin films of SrTiO3 and Sr0.5Ba0.5TiO3

1995 ◽  
Vol 31 (21) ◽  
pp. 1814-1815 ◽  
Author(s):  
A.T. Findikoglu ◽  
D.W. Reagor ◽  
Q.X. Jia ◽  
X.D. Wu
Keyword(s):  
Thin Films ◽  
Dielectric Thin Films ◽  
Nonlinear Dielectric ◽  
Tunable Microwave
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