Low-noise automated measurement system for low-frequency current fluctuations in thin-oxide silicon structures

1992 ◽  
Vol 41 (1) ◽  
pp. 123-127 ◽  
Author(s):  
R. Saletti ◽  
B. Neri
Keyword(s):  
Measurement System ◽  
Low Frequency ◽  
Low Noise ◽  
Current Fluctuations ◽  
Automated Measurement ◽  
Silicon Structures ◽  
Thin Oxide ◽  
Automated Measurement System ◽  
Frequency Current

scholarly journals Unique features of the generation–recombination noise in quasi-one-dimensional van der Waals nanoribbons

Nanoscale ◽  
2018 ◽  
Vol 10 (42) ◽  
pp. 19749-19756 ◽  
Author(s):  
Adane K. Geremew ◽  
Sergey Rumyantsev ◽  
Matthew A. Bloodgood ◽  
Tina T. Salguero ◽  
Alexander A. Balandin
Keyword(s):  
Carrying Capacity ◽  
Van Der Waals ◽  
Low Frequency ◽  
Current Fluctuations ◽  
Electronic Noise ◽  
High Current ◽  
One Dimensional ◽  
Frequency Current

We describe the low-frequency current fluctuations, i.e. electronic noise, in quasi-one-dimensional ZrTe3 van der Waals nanoribbons, which have recently attracted attention owing to their extraordinary high current carrying capacity.

Development of a Prototype Performance Measurement System for Strike Warfare Training Assessment

1988 ◽  
Vol 32 (18) ◽  
pp. 1222-1226
Author(s):  
J. I. Martin ◽  
S. T. Breidenbach ◽  
A. P. Ciavarelli
Keyword(s):  
Performance Measurement ◽  
Measurement System ◽  
Performance Measurement System ◽  
Automated Measurement ◽  
Student Progress ◽  
Training Assessment ◽  
Measurement Systems ◽  
Performance Measurement Systems ◽  
Automated Measurement System

This paper describes methods for developing automated performance measurement systems used with training ranges and simulators. A prototype automated measurement system designed to assess aircrew performance during strike warfare training is presented as an application of this methodology. Methods are also presented for displaying information which is useful in assessing student progress and for diagnosing training results.

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