Effect of imprint on operation and reliability of ferroelectric random access memory (FeRAM)

2001 ◽  
Vol 48 (10) ◽  
pp. 2266-2272 ◽  
Author(s):  
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Y. Hayashi
2018 ◽  
Vol 65 (8) ◽  
pp. 1708-1714 ◽  
Author(s):  
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A. Javanainen ◽  
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...  

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2007 ◽  
Vol 353 (1) ◽  
pp. 242-248
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Ho-Seung Jeon ◽  
Kwang-Hun Park ◽  
Byung-Eun Park ◽  
Chul-Ju Kim ◽  
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