Physical noise modeling of SOI MOSFETs with analysis of the Lorentzian component in the low-frequency noise spectrum
2000 ◽
Vol 47
(6)
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pp. 1192-1201
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2009 ◽
Vol 48
(1)
◽
pp. 10303
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2010 ◽
Vol 31
(9)
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pp. 1035-1037
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1961 ◽
Vol 66
(9)
◽
pp. 2787-2792
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