A floating-gate transmission-line model technique for measuring source resistance in heterostructure field-effect transistors
1989 ◽
Vol 36
(11)
◽
pp. 2386-2393
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1990 ◽
Vol 37
(9)
◽
pp. 2105-2107
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Keyword(s):
2017 ◽
Vol 71
(12)
◽
pp. 963-967
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Keyword(s):