Determination of the electric field at interfaces in amorphous-silicon devices using time-of-flight measurements
1989 ◽
Vol 36
(12)
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pp. 2803-2809
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1977 ◽
Vol 17
(5)
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pp. 625-632
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1987 ◽
Vol 48
(2)
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pp. 227-232
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2015 ◽
Vol 33
(9)
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pp. 1002
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1990 ◽
Vol 287
(3)
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pp. 374-377
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