Determination of the electric field at interfaces in amorphous-silicon devices using time-of-flight measurements

1989 ◽  
Vol 36 (12) ◽  
pp. 2803-2809 ◽  
Author(s):  
H.M. Wentinck ◽  
W. Crans
2012 ◽  
Vol 51 (21) ◽  
pp. 5326 ◽  
Author(s):  
Babar Hussain ◽  
Mushtaq Ahmed ◽  
M. Nawaz ◽  
M. Saleem ◽  
M. Razzaq ◽  
...  

1990 ◽  
Vol 57 (5) ◽  
pp. 478-480 ◽  
Author(s):  
R. Könenkamp ◽  
S. Muramatsu ◽  
H. Itoh ◽  
S. Matsubara ◽  
T. Shimada

1977 ◽  
Vol 17 (5) ◽  
pp. 625-632
Author(s):  
Yu. E. Voskoboinikov ◽  
A. E. Zarvin ◽  
A. A. Poltavets ◽  
Ya. Ya. Tomsons ◽  
R. G. Sharafutdinov

1972 ◽  
Vol 25 (5) ◽  
pp. 523 ◽  
Author(s):  
LGH Huxley

A mathematical model for a group of electrons drifting in a gas in a uniform electric field is proposed. The relevance of this model for the assessment of the errors that arise from forward and backward diffusion to anode and cathode in time of flight measurements of drift velocity is discussed. The theory of steady streams from pole and dipole sources is related to that of the travelling group.


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