Hole trapping during low gate bias, high drain bias hot-carrier injection in n-MOSFETs at 77 K

1992 ◽  
Vol 39 (4) ◽  
pp. 851-857 ◽  
Author(s):  
P. Heremans ◽  
G. Groeseneken ◽  
H.E. Maes
Keyword(s):  
Gate Bias ◽  
Carrier Injection ◽  
Hot Carrier ◽  
Hole Trapping ◽  
Hot Carrier Injection ◽  
Drain Bias

Analysis of Hot Carrier Injection According to Gate Length

2019 ◽  
Vol 19 (10) ◽  
pp. 6746-6749 ◽  
Author(s):  
Taejin Jang ◽  
Myung-Hyun Baek ◽  
Min-Woo Kwon ◽  
Sungmin Hwang ◽  
Jeesoo Chang ◽  
...  
Keyword(s):  
Gate Length ◽  
Carrier Injection ◽  
Hot Carrier ◽  
Hot Carrier Injection
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