scholarly journals Design of a fault-tolerant three-dimensional dynamic random-access memory with on-chip error-correcting circuit

1993 ◽  
Vol 42 (12) ◽  
pp. 1453-1468 ◽  
Author(s):  
P. Mazumder
Keyword(s):  
Fault Tolerant ◽  
Three Dimensional ◽  
Random Access ◽  
Random Access Memory ◽  
Dynamic Random Access Memory ◽  
Access Memory ◽  
On Chip

scholarly journals Analysis of the Sensing Margin of Silicon and Poly-Si 1T-DRAM

Micromachines ◽  
2020 ◽  
Vol 11 (2) ◽  
pp. 228
Author(s):  
Hyeonjeong Kim ◽  
Songyi Yoo ◽  
In-Man Kang ◽  
Seongjae Cho ◽  
Wookyung Sun ◽  
...  
Keyword(s):  
Three Dimensional ◽  
Random Access ◽  
Random Access Memory ◽  
Cost Effective ◽  
Dynamic Random Access Memory ◽  
Silicon On Insulator ◽  
Floating Body ◽  
Thin Body ◽  
Access Memory ◽  
The Cost

Recently, one-transistor dynamic random-access memory (1T-DRAM) cells having a polysilicon body (poly-Si 1T-DRAM) have attracted attention as candidates to replace conventional one-transistor one-capacitor dynamic random-access memory (1T-1C DRAM). Poly-Si 1T-DRAM enables the cost-effective implementation of a silicon-on-insulator (SOI) structure and a three-dimensional (3D) stacked architecture for increasing integration density. However, studies on the transient characteristics of poly-Si 1T-DRAM are still lacking. In this paper, with TCAD simulation, we examine the differences between the memory mechanisms in poly-Si and silicon body 1T-DRAM. A silicon 1T-DRAM cell’s data state is determined by the number of holes stored in a floating body (FB), while a poly-Si 1T-DRAM cell’s state depends on the number of electrons trapped in its grain boundary (GB). This means that a poly-Si 1T-DRAM can perform memory operations by using GB as a storage region in thin body devices with a small FB area.

A fault-tolerant 64K dynamic random-access memory

1979 ◽  
Vol 26 (6) ◽  
pp. 853-860 ◽  
Author(s):  
R.P. Cenker ◽  
D.G. Clemons ◽  
W.R. Huber ◽  
J.B. Petrizzi ◽  
F.J. Procyk ◽  
...  
Keyword(s):  
Fault Tolerant ◽  
Random Access ◽  
Random Access Memory ◽  
Dynamic Random Access Memory ◽  
Access Memory

Sub-6F2 Charge Trap Dynamic Random Access Memory Using a Novel Operation Scheme

2006 ◽  
Author(s):  
Zongliang Huo ◽  
Seungjae Baik ◽  
Shieun Kim ◽  
In-seok Yeo ◽  
U-in Chung ◽  
...  
Keyword(s):  
Random Access ◽  
Random Access Memory ◽  
Dynamic Random Access Memory ◽  
Access Memory ◽  
Charge Trap
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