Electrically Active and Inactive B Lattice Sites in Ultrahighly B Doped Si(001): An X-Ray Near-Edge Absorption Fine-Structure and High-Resolution Diffraction Study

1999 ◽  
Vol 82 (22) ◽  
pp. 4464-4467 ◽  
Author(s):  
A. Vailionis ◽  
G. Glass ◽  
P. Desjardins ◽  
David G. Cahill ◽  
J. E. Greene
Keyword(s):  
Fine Structure ◽  
High Resolution ◽  
Diffraction Study ◽  
X Ray ◽  
Edge Absorption ◽  
Absorption Fine

EFFECT OF HEAT TREATMENT ON MICROSTRUCTURE AND MAGNETOSTRICTIVE PROPERTY OF MELT-SPUN Fe85Ga15 RIBBONS

2013 ◽  
Vol 27 (30) ◽  
pp. 1350174 ◽  
Author(s):  
HAO LIU ◽  
HAIOU WANG ◽  
MENGXIONG CAO ◽  
WEISHI TAN ◽  
YANGGUANG SHI ◽  
...  
Keyword(s):  
Heat Treatment ◽  
Fine Structure ◽  
High Resolution ◽  
Nearest Neighbor ◽  
Annealed Sample ◽  
X Ray Diffraction ◽  
X Ray ◽  
Absorption Fine ◽  
Melt Spun ◽  
X Ray Absorption

In order to study the microstructure of Fe – Ga alloy, Fe 85 Ga 15 ribbons prepared with different wheel velocity were studied by high resolution X-ray diffraction (HRXRD) and extend X-ray absorption fine structure (EXAFS). HRXRD patterns showed that only disordered A 2 phase was observed in as-cast Fe 85 Ga 15 alloy. A modified- DO 3 phase was detected in all of the melt spun samples. The HRXRD associated with EXAFS results indicated that Ga atoms were located as second-nearest neighbor along [100] orientation. A little DO 3 phase was found in ribbons annealed at 1000°C under 0.06 MPa Ar atmosphere. The result of magnetostriction measurement revealed that in the ribbon prepared with higher wheel velocity, more modified- DO 3 phase will enhance the magnetostriction. DO 3 phase in the annealed sample will deteriorate the magnetostrictive properties of Fe – Ga ribbons.

3C-, 4H- and 6H-SiC Bulks Studied by Silicon K-Edge X-Ray Absorption

2013 ◽  
Vol 740-742 ◽  
pp. 573-576 ◽  
Author(s):  
Wei Zeng ◽  
Zhe Chuan Feng ◽  
Rui Sheng Zheng ◽  
Ling Yun Jang ◽  
Chee Wei Liu
Keyword(s):  
Electronic Structure ◽  
Fine Structure ◽  
High Resolution ◽  
Synchrotron Radiation ◽  
Angular Dependence ◽  
Comparative Studies ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

High-resolution synchrotron radiation X-ray absorption of Si K-edge have been employed to investigate 6H-, 4H- and 3C-SiC. Detailed analyses of the extended x-ray absorption fine structure are taken by using the IFEFFIT program, and significant results on the atomic bonding are obtained from these comparative studies. The x-ray absorption near-edge structures of the Si K-edge are investigated, and the electronic structure of 3C-, 4H- and 6H-SiC are studied. In order to investigate the angular dependence, the x-ray absorption near-edge spectra were operated at 55o and 90o of the angle between the surface and the X-ray direction.

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