Real-Time Analysis of GaSb(001) during Sb Desorption by Core-Level Photoelectron Spectroscopy

1997 ◽  
Vol 78 (22) ◽  
pp. 4233-4236 ◽  
Author(s):  
Fumihiko Maeda ◽  
Yoshio Watanabe ◽  
Masaharu Oshima
1998 ◽  
Vol 5 (3) ◽  
pp. 1026-1028 ◽  
Author(s):  
Fumihiko Maeda ◽  
Yoshio Watanabe ◽  
Masaharu Oshima ◽  
Masami Taguchi ◽  
Retsu Oiwa

A system has been developed for the real-time analysis of surface reactions during molecular beam epitaxial growth which uses photoelectron spectroscopy with VUV light taken from synchrotron radiation. This system consists of a synchrotron radiation beamline and growth/analysis apparatus in which photoelectron spectroscopy is performed with sub-second time resolution. In this system, photoelectron spectra are measured in sequence by a `non-scanning' measurement method that enables the acquisition of snapshot photoelectron spectra using a multi-channel detector. This non-scanning measurement method was enabled by equipping an electric field correction grid. This system was used to monitor the photoelectron spectra of a GaSb(001) surface.


Author(s):  
R.P. Goehner ◽  
W.T. Hatfield ◽  
Prakash Rao

Computer programs are now available in various laboratories for the indexing and simulation of transmission electron diffraction patterns. Although these programs address themselves to the solution of various aspects of the indexing and simulation process, the ultimate goal is to perform real time diffraction pattern analysis directly off of the imaging screen of the transmission electron microscope. The program to be described in this paper represents one step prior to real time analysis. It involves the combination of two programs, described in an earlier paper(l), into a single program for use on an interactive basis with a minicomputer. In our case, the minicomputer is an INTERDATA 70 equipped with a Tektronix 4010-1 graphical display terminal and hard copy unit.A simplified flow diagram of the combined program, written in Fortran IV, is shown in Figure 1. It consists of two programs INDEX and TEDP which index and simulate electron diffraction patterns respectively. The user has the option of choosing either the indexing or simulating aspects of the combined program.


2020 ◽  
Vol 67 (4) ◽  
pp. 1197-1205 ◽  
Author(s):  
Yuki Totani ◽  
Susumu Kotani ◽  
Kei Odai ◽  
Etsuro Ito ◽  
Manabu Sakakibara

2021 ◽  
Vol 2021 (4) ◽  
pp. 7-16
Author(s):  
Sivaraman Eswaran ◽  
Aruna Srinivasan ◽  
Prasad Honnavalli

2021 ◽  
Vol 57 (28) ◽  
pp. 3430-3444
Author(s):  
Vinod Kumar

This article describes our journey and success stories in the development of chemical warfare detection, detailing the range of unique chemical probes and methods explored to achieve the specific detection of individual agents in realistic environments.


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